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IEEE Circuits and Devices Magazine, 1992
Verifying the design and simulation of 256 K SRAM relies on measurements of waveforms on internal nodes along a critical path. A technique for producing accurate measurements of these waveforms using electron-beam probing is described. Comparisons of measured and simulated waveforms at several points on a chip are presented.
K.A. Jenkins, S.E. Doyle
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Verifying the design and simulation of 256 K SRAM relies on measurements of waveforms on internal nodes along a critical path. A technique for producing accurate measurements of these waveforms using electron-beam probing is described. Comparisons of measured and simulated waveforms at several points on a chip are presented.
K.A. Jenkins, S.E. Doyle
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2018Memory has always been the basic structural component of electronic circuits. Almost all electronic devices, from a simple digital clock to a multiprocessing computer system, embed an amount of memory in their circuitry. Memory is necessary for temporary or permanent storage and for faster access of the data used by the processors. Over the last decade
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Proceedings of the 59th ACM/IEEE Design Automation Conference, 2022
He Zhang +6 more
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He Zhang +6 more
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2012
The trend of Static Random Access Memory (SRAM) along with CMOS technology scaling in different processors and system-on-chip (SoC) products has fuelled the need of innovation in the area of SRAM design. SRAM bitcells are made of minimum geometry devices for high density and to keep the pace with CMOS technology scaling, as a result, they are the first
Jawar Singh +2 more
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The trend of Static Random Access Memory (SRAM) along with CMOS technology scaling in different processors and system-on-chip (SoC) products has fuelled the need of innovation in the area of SRAM design. SRAM bitcells are made of minimum geometry devices for high density and to keep the pace with CMOS technology scaling, as a result, they are the first
Jawar Singh +2 more
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Oris (Zagreb), 2013
Prikaz umjetničkog opusa i recnetnih radova hrvatskog umjetnika Zlatka ...
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Prikaz umjetničkog opusa i recnetnih radova hrvatskog umjetnika Zlatka ...
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2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers, 2008
Hiroyuki Yamauchi, Peter Rickert
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Hiroyuki Yamauchi, Peter Rickert
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IEEE Spectrum, 2010
A new type of lithography that uses an electron beam to spark a chemical reaction could provide a way to build incredibly tiny transistors, which the chipmaking industry will require in a few years. Researchers from Taiwan and the University of California, Berkeley, say they've made static RAM that anticipates 16-nanometer chip features using a new ...
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A new type of lithography that uses an electron beam to spark a chemical reaction could provide a way to build incredibly tiny transistors, which the chipmaking industry will require in a few years. Researchers from Taiwan and the University of California, Berkeley, say they've made static RAM that anticipates 16-nanometer chip features using a new ...
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This document provides a comprehensive implementation checklist for practitioners deploying the Sabotage Risk Assessment and Mitigation (SRAM) framework. While the theoretical foundations of SRAM provide the "why," this checklist provides the "how," translating methodology into a structured sequence of actionable steps.
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