Results 171 to 180 of about 855 (207)
Some of the next articles are maybe not open access.
Providing Root of Trust for ARM TrustZone using On-Chip SRAM
Proceedings of the 4th International Workshop on Trustworthy Embedded Devices, 2014We present the design, implementation and evaluation of the root of trust for the Trusted Execution Environment (TEE) provided by ARM TrustZone based on the on-chip SRAM Physical Unclonable Functions (PUFs). We first implement a building block which provides the foundations for the root of trust: secure key storage and truly random source. The building
Shijun Zhao +4 more
openaire +1 more source
Analysis and On-Chip Monitoring of Gate Oxide Breakdown in SRAM Cells
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2012Scaling of device sizes has reduced gate oxide thickness to a few atomic layers, increasing the vulnerability of the gate oxide to breakdown. During breakdown, devices go through a gradual wearout process characterized by increased leakage. Using experimentally verified gate oxide breakdown models, a detailed analysis of the effect of progressive gate ...
Fahad Ahmed, Linda Milor
openaire +1 more source
Precharged sram cell for ultra low-power on-chip cache
2005 Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005This paper proposes an ultra low-power technique to reduce dynamic and leakage power in SRAM. At write mode, the technique reduces the voltage swing required on the bit lines and depends on the cell itself to amplify the small swing to full swing. HSPICE simulation shows 94.2% write power saving in 0.18nm technology.
Ramy E. Aly, Magdy A. Bayoumi
openaire +1 more source
Immunity Evaluation of SRAM Chips for SOI and SI Technology
2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2019This paper mainly studies the electromagnetic immunity of two kinds of static random access memory (SRAM) chips using bulk silicon (SI) and insulator silicon (SOI) technologies respectively, and the effect of temperature on chip immunity. Direct power injection (DPI) method was used to test the immunity of each functional pin of the two chips, and the ...
Xujing Wu +7 more
openaire +1 more source
A 5V-only single chip microcomputer with nonvolatile SRAM
1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1984An 8b single chip microprocessor with a memory containing 32Kb of ROM, 512b of RAM and 512b of nonvolatile SRAM, implemented in 4μm double poly floating gate technology, will be described.
P. Rosini, R. Finaurini, M. Gaibotti
openaire +1 more source
On-line monitoring of system health using on-chip SRAMs as a wearout sensor
2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS), 2017Safety critical systems need methodologies for chips to monitor their health in the field, so that the need for repairs can be determined during scheduled maintenance. Prior work provides health monitoring via detection of degradation. Since many wearout mechanisms provide no degradation signal, this paper proposes to use the embedded SRAM as a dynamic
Woongrae Kim, Taizhi Liu, Linda Milor
openaire +1 more source
Design and Analysis of a Self-Repairing SRAM with On-Chip Monitor and Compensation Circuitry
26th IEEE VLSI Test Symposium (vts 2008), 2008In an SRAM array, the systematic inter-die and the random within-die variations in process parameters cause significant number of parametric failures, to degrade process yield in the nanometer technology regime. In this paper, we investigate the interaction between the inter-die and intra-die Vt variations on SRAM read and write failures.
Niladri Narayan Mojumder +4 more
openaire +1 more source
On-chip aging sensor to monitor NBTI effect in nano-scale SRAM
2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012Today, the increasing need to store more and more information has resulted in the fact that Static Random Access Memories (SRAMs) occupy the greatest part of a System-on-Chip (SoC). Therefore, SRAM's robustness is considered crucial in order to guarantee the reliability of such SoCs over lifetime.
Arthur Ceratti +3 more
openaire +1 more source
Eliminating energy of same-content-cell-columns of on-chip SRAM arrays
IEEE/ACM International Symposium on Low Power Electronics and Design, 2011Conference code ...
Ahsan, B. +11 more
openaire +3 more sources
Low-Power Technique for SRAM-Based On-Chip Arbitrary-Waveform Generator
IEEE Transactions on Instrumentation and Measurement, 2011A low-power technique for a static random-access memory (SRAM)-based on-chip arbitrary-waveform generator (AWG) is proposed for two types of analog-signal-processing applications: multiresolution spectrum sensing and matched filter. The SRAM has an embedded address generator to limit the operation in a sequential-access mode of the AWG. Then, the power
Song, Taejoong +9 more
openaire +2 more sources

