A High-Reliability 12T SRAM Radiation-Hardened Cell for Aerospace Applications. [PDF]
Yao R +6 more
europepmc +1 more source
Optimization of Gate-All-Around Device to Achieve High Performance and Low Power with Low Substrate Leakage. [PDF]
Yoo C, Chang J, Park S, Kim H, Jeon J.
europepmc +1 more source
Investigating the impact of irradiation on various ringFET-based SRAM circuits using 3D TCAD. [PDF]
Anandhi R, Nagarajan KK, Ramya M.
europepmc +1 more source
Threshold Voltage Adjustment by Varying Ge Content in SiGe p-Channel for Single Metal Shared Gate Complementary FET (CFET). [PDF]
Sun CJ +6 more
europepmc +1 more source
Reliability-Aware Semantic Gating with Retrieval-Augmented Association for Online Multi-Object Tracking Under Industrial Low-Altitude Proxy Conditions. [PDF]
Guo R, He Y.
europepmc +1 more source
Impact of material and structural parameters on the performance of advanced low-power CNTFET-based SRAM designs. [PDF]
Fuad MH, Nayan MF.
europepmc +1 more source
3-Tier CFET 6T-SRAM with 2D-TMDs channels for Angstrom technology node. [PDF]
Lee J +5 more
europepmc +1 more source
A CNTFET based process variation resilient SRAM design for stable low power and half select free operation. [PDF]
Haq SU +5 more
europepmc +1 more source
First Demonstration of Hysteresis-Free IGZO/SnO-Based Complementary Circuits and SRAM with Long-Term Reliability Using SU-8 Passivation. [PDF]
Han C +7 more
europepmc +1 more source
A Weighted NBTI/HCD Coupling Model in Full VG/VD Bias Space with Applications to SRAM Aging Simulation. [PDF]
Chai Z, Wu Z.
europepmc +1 more source

