Results 21 to 30 of about 2,685 (210)

ZnO/graphene ambipolar transistor with low sub-threshold swing

open access: yesMaterials Research Express, 2021
We reported on enhanced device performance of ambipolar thin-film transistors (TFTs) with hybrid channel of Zinc oxide (ZnO) and multi-layer graphene (MLG), especially in reduced sub-threshold swing characteristics and increased carrier mobilities for ...
Byeong-Hyeok Kim   +2 more
doaj   +1 more source

A Steep-Slope Transistor Combining Phase-Change and Band-to-Band-Tunneling to Achieve a sub-Unity Body Factor

open access: yesScientific Reports, 2017
Steep-slope transistors allow to scale down the supply voltage and the energy per computed bit of information as compared to conventional field-effect transistors (FETs), due to their sub-60 mV/decade subthreshold swing at room temperature.
Wolfgang A. Vitale   +10 more
doaj   +1 more source

Ferroelectric gate tunnel field-effect transistors with low-power steep turn-on

open access: yesAIP Advances, 2014
Using a ferroelectric PbZrTiO3 gate stack, the range of the steep subthreshold swing in tunnel field-effect transistors was extended by 3.5 orders of magnitude demonstrating an improvement in the swing (by approximately double the slope).
M. H. Lee   +5 more
doaj   +1 more source

Novel Quantum Structure of an III-V Tunneling Field-Effect Transistor with Source and Channel Heterojunction

open access: yesHolos, 2020
In this work, an III-V tunneling field-effect transistor (TFET) with source and channel heterojunctions is proposed and introduced. Proposed structure combine the high tunneling efficiency induced by heterojunction material and the high mobility of III-V
Masoud Sabaghi
doaj   +1 more source

Low-Power OR Logic Ferroelectric In-Situ Transistor Based on a CuInP2S6/MoS2 Van Der Waals Heterojunction

open access: yesNanomaterials, 2021
Due to the limitations of thermodynamics, the Boltzmann distribution of electrons hinders the further reduction of the power consumption of field-effect transistors.
Kun Yang   +3 more
doaj   +1 more source

Investigation of Channel Doping Concentration and Reverse Boron Penetration on P-Type Pi-Gate Poly-Si Junctionless Accumulation Mode FETs

open access: yesIEEE Journal of the Electron Devices Society, 2018
In this paper, the influence of channel doping concentration and reverse boron penetration on p-type Pi-gate (PG) poly-Si junctionless accumulation mode (JAM) FETs has been experimentally investigated and discussed. Effective carrier concentration (Neff)
Dong-Ru Hsieh   +3 more
doaj   +1 more source

A temperature dependent analytical model & performance evaluation of triple-material dielectric-pocket gate-all-around MOSFET

open access: yesDiscover Applied Sciences
In current article, an analytical model of a Triple-Material Dielectric-Pocket Gate-All-Around (TM-DP-GAA) MOSFET has been presented for elevated temperature conditions. The numerical model of surface potential has been developed for temperatures ranging
Neeraj Gupta   +4 more
doaj   +1 more source

Could the negative capacitance effect be used in field-effect transistors with a ferroelectric gate?

open access: yesФізика і хімія твердого тіла, 2022
We analyze the electric potential and field, polarization and charge, and differential capacitance of a silicon metal-oxide-ferroelectric field effect transistor (MOSFET), in which a gate insulator consists of thin layers of dielectric SiO2 and weak ...
E. A. Eliseev   +3 more
doaj   +1 more source

Oxygen‐Tunnel Indium Tin Oxide Vertical Channel Transistors with Enhanced Current Density and Reliability for Monolithic 3D Compute‐In‐Memory Systems

open access: yesAdvanced Functional Materials, EarlyView.
Oxygen‐tunnel (OT) indium tin oxide (ITO) vertical channel transistors (VCTs) enable reliable, high‐density gain‐cell memory for monolithic 3D integration. A sandwiched SiN/SiO2/SiN OT stack selectively regulates oxygen transport, suppressing parasitic electrode oxidation while stabilizing channel oxygen vacancies, thereby suppressing carrier injection
Hyeonho Gu   +17 more
wiley   +1 more source

High drain field impact ionization transistors as ideal switches

open access: yesNature Communications
Impact ionization effect has been demonstrated in transistors to enable sub-60 mV dec−1 subthreshold swing. However, traditionally, impact ionization in silicon devices requires a high operation voltage due to limited electrical field near the device ...
Baowei Yuan   +25 more
doaj   +1 more source

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