Results 31 to 40 of about 24,114 (195)

TCAD EIC Message: February 2019 [PDF]

open access: yesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2019
As we close out the year 2018, it is time to reflect back a number of milestones achieved throughout the year. The transition to the new EIC and team included a 50-member editorial board with 19 new members selected after an extensive round of open call for editorial board nominations.
Brisk, Philip   +5 more
openaire   +3 more sources

A Physical TCAD Mobility Model of Amorphous In-Ga-Zn-O (a-IGZO) Devices with Spatially Varying Mobility Edges, Band-Tails, and Enhanced Low-Temperature Convergence

open access: yesMicromachines
Amorphous indium gallium zinc oxide (a-IGZO) is becoming an increasingly important technological material. Transport in this material is conceptualized as the heavy disorder of the material causing a conduction or mobility band-edge that randomly varies ...
Mischa Thesberg   +7 more
doaj   +1 more source

Investigation of electron trapping in AlGaN/GaN HEMT with Fe-doped buffer through DCT characterization and TCAD device simulations

open access: yesAIP Advances, 2021
The electron trapping in AlGaN/GaN high-electron mobility transistors (HEMTs) with iron (Fe)-doped buffer is investigated through Drain Current Transient (DCT) measurements and TCAD physics-based 2D device simulations.
Mohamed Bouslama   +4 more
doaj   +1 more source

Simulation of radiation-induced defects

open access: yes, 2015
Mainly due to their outstanding performance the position sensitive silicon detectors are widely used in the tracking systems of High Energy Physics experiments such as the ALICE, ATLAS, CMS and LHCb at LHC, the world's largest particle physics ...
Peltola, Timo
core   +1 more source

Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability [PDF]

open access: yes, 2014
In this paper we illustrate how by using advanced atomistic TCAD tools the interplay between long-range process variation and short-range statistical variability in FinFETs can be accurately modelled and simulated for the purposes of Design-Technology Co-
Asenov, A.   +4 more
core   +1 more source

Comparative Characterization of NWFET and FinFET Transistor Structures Using TCAD Modeling

open access: yesMicromachines, 2022
A complete comparison for 14 nm FinFET and NWFET with stacked nanowires was carried out. The electrical and thermal performances in two device structures were analyzed based on TCAD simulation results.
Konstantin O. Petrosyants   +2 more
doaj   +1 more source

Does a Nanowire Transistor Follow the Golden Ratio? A 2D Poisson-Schrödinger/3D Monte Carlo Simulation Study [PDF]

open access: yes, 2017
In this work, we observed the signatures of isotropic charge distributions showing the same attributes as the golden ratio (Phi) described in art and architecture, we also present a simulation study of ultra-scaled n-type silicon nanowire transistors ...
Adamu-Lema, Fikru   +3 more
core   +1 more source

Atoms-to-Circuits Simulation Investigation of CNT Interconnects for Next Generation CMOS Technology [PDF]

open access: yes, 2017
In this study, we suggest a hierarchical model to investigate the electrical performance of carbon nanotube (CNT)- based interconnects. From the density functional theory, we have obtained important physical parameters, which are used in TCAD ...
Amoroso, Salvatore M.   +11 more
core   +3 more sources

Triple combination antiviral drug (TCAD) composed of amantadine, oseltamivir, and ribavirin impedes the selection of drug-resistant influenza A virus.

open access: yesPLoS ONE, 2011
Widespread resistance among circulating influenza A strains to at least one of the anti-influenza drugs is a major public health concern. A triple combination antiviral drug (TCAD) regimen comprised of amantadine, oseltamivir, and ribavirin has been ...
Justin D Hoopes   +8 more
doaj   +1 more source

Novel TCAD oriented definition of the off-state breakdown voltage in Schottky-gate FETs: a 4H SiC MESFET case study [PDF]

open access: yes, 2008
Physics-based breakdown voltage optimization in Schottky-barrier power RF and microwave field-effect transistors as well as in high-speed power-switching diodes is today an important topic in technology computer-aided design (TCAD).
Bonani, Fabrizio   +2 more
core   +1 more source

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