Results 101 to 110 of about 5,839,066 (223)

Symbolic Model Evaluation for TCAD Device Simulation

open access: yes, 2009
Symbolic model evaluation is a powerful method for de- veloping models for technology computer-aided design (TCAD) device simulation. It gives users the ability to accurately describe physical phenomena. Coupled with automatic creation of derivative expressions, new models can be rapidly developed with performance rivaling source code approaches. A new
openaire   +1 more source

Overview of software tools for modeling single event upsets in microelectronic devices

open access: yesБезопасность информационных технологий, 2016
The paper presents the results of the analysis of existing simulation tools for evaluation of single event upset susceptibility of microelectronic devices with deep sub-micron feature sizes. This simulation tools are meant to replace obsolete approach to
Anatoly Alexandrovich Smolin
doaj  

Heavy Ions Induced Single-Event Transient in SiGe-on-SOI HBT by TCAD Simulation. [PDF]

open access: yesMicromachines (Basel)
Long Y   +10 more
europepmc   +1 more source

TCAD simulations of silicon strip and pixel [PDF]

open access: yesProceedings of The 20th Anniversary International Workshop on Vertex Detectors — PoS(Vertex 2011), 2012
openaire   +1 more source

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