A New Nonlinear Model of Body Resistance in Nanometer PD SOI MOSFETs [PDF]
Journal of Intelligent Procedures in Electrical Technology, 2011 In this paper, a nonlinear model for the body resistance of a 45nm PD SOI MOSFET is developed. This model verified on the base of the small signal three-dimensional simulation results.
Arash Daghighi, Azam Askari Khoshuei
doaj
Physics-Based TCAD Simulation and Calibration of 600 V GaN/AlGaN/GaN Device Characteristics and Analysis of Interface Traps. [PDF]
Micromachines (Basel), 2021 Song YL, Reddy MK, Chang LM, Sheu G.
europepmc +1 more source
TCAD Silicon Sensor Simulations [PDF]
Proceedings of The 20th Anniversary International Workshop on Vertex Detectors — PoS(Vertex 2011), 2012 openaire +2 more sources
Fully Depleted Monolithic Active Microstrip Sensors: TCAD Simulation Study of an Innovative Design Concept. [PDF]
Sensors (Basel), 2021 De Cilladi L +4 more
europepmc +1 more source
A Novel Nitrogen Ion Implantation Technique for Turning Thin Film "Normally On" AlGaN/GaN Transistor into "Normally Off" Using TCAD Simulation. [PDF]
Membranes (Basel), 2021 Sheu G +4 more
europepmc +1 more source
Simulation and Modeling of Novel Electronic Device Architectures with NESS (Nano-Electronic Simulation Software): A Modular Nano TCAD Simulation Framework. [PDF]
Micromachines (Basel), 2021 Medina-Bailon C +6 more
europepmc +1 more source
Physics-based Small-Signal sensitivity analysis for the variability aware assessment of devices and linear analog subsystems [PDF]
, 2011 Bonani, Fabrizio +3 more
core
Overview of software tools for modeling single event upsets in microelectronic devices
Безопасность информационных технологий, 2016 The paper presents the results of the analysis of existing simulation tools for evaluation of single event upset susceptibility of microelectronic devices with deep sub-micron feature sizes. This simulation tools are meant to replace obsolete approach to
Anatoly Alexandrovich Smolin
doaj
Investigation of Monolithic 3D Integrated Circuit Inverter with Feedback Field Effect Transistors Using TCAD Simulation. [PDF]
Micromachines (Basel), 2020 Oh JH, Yu YS.
europepmc +1 more source
TCAD simulations of silicon strip and pixel [PDF]
Proceedings of The 20th Anniversary International Workshop on Vertex Detectors — PoS(Vertex 2011), 2012 openaire +1 more source