Results 261 to 270 of about 76,098 (279)

Characteristics of a mixed-gas cluster ion beam for time-of-flight secondary ion mass spectrometry

Applied Surface Science, 2022
Chang Min Choi, Ji Young Baek, Myoung Choul Choi   +2 more
exaly  

Liquid secondary ion time-of-flight mass spectrometry

Analytical Chemistry, 1984
openaire   +1 more source

Time-of-Flight Secondary Ion Mass Spectrometry, Secondary Neutral Mass Spectrometry, and Resonance Ionization Mass Spectrometry

2014
T. Henkel, J. Gilmour
openaire   +1 more source

Time-of-flight secondary ion mass spectrometry of perfluorinated polyethers

Analytical Chemistry, 1990
Ioannis V. Bletsos, David M. Hercules, Dieter. VanLeyen, Alfred. Benninghoven, David. Fowler   +4 more
openaire   +1 more source

Time-of-flight secondary ion mass spectrometry as a screening method for the identification of degradation products in lithium-ion batteries—A multivariate data analysis approach

Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics, 2016
Danica Heller, Birgit Hagenhoff, Carsten Engelhard   +2 more
exaly  

Time-of-flight secondary ion mass spectrometry with transmission of energetic primary cluster ions through foil targets

Review of Scientific Instruments, 2014
K Hirata, K Narumi
exaly  

Application of time of flight secondary ion mass spectrometry to the in situ analysis of ballpoint pen inks on paper

Forensic Science International, 2009
K Paul Kirkbride, William Skinner
exaly  

The characterization of an imaging time‐of‐flight secondary ion mass spectrometry instrument

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 1989
J C Vickerman
exaly  

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

2001
openaire   +1 more source

Time‐of‐flight secondary ion mass spectrometry of insulators with pulsed charge compensation by low‐energy electrons

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 1989
B Hagenhoff
exaly