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Time-of-Flight Secondary Ion Mass Spectrometry
2018Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is one of the most powerful surface analysis methods in terms of high sensitivity, high spatial resolution imaging, and detailed chemical information.
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Time-of-flight secondary ion mass spectrometry of polymer materials
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1989Secondary ion formation from polystyrene standards with well-defined molecular weight distributions between 103 and 106 amu has systematically been investigated. Maximum yields of cationized fragments and oligomers are obtained from silver substrates covered by about one monolayer of polymer material. Intact oligomers of polystyrene are detected in the
D. van Leyen +5 more
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Characterization of adsorbed protein films by time of flight secondary ion mass spectrometry
Journal of Biomedical Materials Research, 2001Time of flight secondary ion mass spectrometry (ToF-SIMS) is a useful technique in the study of adsorbed protein films because of its high surface sensitivity and chemical selectivity. However, the protein mass spectra generated by ToF-SIMS are complex fragmentation patterns of a polymer consisting of 20 different monomers (i.e., amino acids ...
J B, Lhoest +3 more
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Journal of Chromatography A, 2005
New on-line analytical system coupling thin layer chromatography (TLC) and high selective identification unit-time of flight secondary ion mass spectrometry (TOF-SIMS) is introduced in this article. Chromatographic mixture separation and analyte surface deposition followed with surface TOF-SIMS analysis on-line allows to identify the analytes at trace ...
Andrej, Orinák +4 more
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New on-line analytical system coupling thin layer chromatography (TLC) and high selective identification unit-time of flight secondary ion mass spectrometry (TOF-SIMS) is introduced in this article. Chromatographic mixture separation and analyte surface deposition followed with surface TOF-SIMS analysis on-line allows to identify the analytes at trace ...
Andrej, Orinák +4 more
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Rapid Communications in Mass Spectrometry, 2000
A series of 16 polyarylates, with well-controlled and systematically varying chemistry, has been characterized by time-of-flight secondary ion mass spectrometry (TOF-SIMS). The polymers are structurally identical except for the incremental additions of C2H4 units to the backbone and sidechain.
A M, Belu +3 more
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A series of 16 polyarylates, with well-controlled and systematically varying chemistry, has been characterized by time-of-flight secondary ion mass spectrometry (TOF-SIMS). The polymers are structurally identical except for the incremental additions of C2H4 units to the backbone and sidechain.
A M, Belu +3 more
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Rapid Communications in Mass Spectrometry, 2006
Abstract Tandem mass spectrometry measurements have been achieved using time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) and a post source decay (PSD)‐like method. The performance of the method has been demonstrated on model molecules with well‐known fragmentation pathways.
David, Touboul +2 more
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Abstract Tandem mass spectrometry measurements have been achieved using time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) and a post source decay (PSD)‐like method. The performance of the method has been demonstrated on model molecules with well‐known fragmentation pathways.
David, Touboul +2 more
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Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
1996Secondary ion mass spectrometry in the “static mode” is becoming a key technique for the surface characterization of organic materials. This is due to the very specific chemical information derived from characteristic molecular secondary ions. The present expansion of this technique is related to the development of high performance time-of-flight mass ...
Patrick Bertrand, Weng Lu-Tao
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Time-of-flight secondary neutral & ion mass spectrometry using swift heavy ions
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2015Abstract We report on a new time-of-flight (TOF) spectrometer designed to investigate sputtering phenomena induced by swift heavy ions in the electronic stopping regime. In this experiment, particular emphasis is put on the detection of secondary ions along with their emitted neutral counterparts in order to examine the ionization efficiency of the ...
Breuer, Lars +4 more
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Peptide Analysis by Time-of-flight Secondary Ion Mass Spectrometry
1989High sensitivity, specifity and speed are widely recognized characteristics of mass spectrometry which make it suitable for the analysis of peptides and their posttranslational modifications [Ben87].
A. Benninghoven +4 more
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Time-of-Flight Secondary Ion Mass Spectrometry - A Chemical Microscope
Microscopy and Microanalysis, 2006Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3 ...
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