Results 271 to 279 of about 76,098 (279)

Time-of-flight secondary ion mass spectrometry chemical imaging analysis of micropatterns of streptavidin and cells without labeling

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 2006
Tae GeoL Lee, Kyung-Bok Lee, Jinmo Kim
exaly  

Self-assembled monolayers for polymer and protein cationization with time-of-flight secondary ion mass spectrometry

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 2000
Roger Michel, Daniel J Graham, Buddy D Ratner   +2 more
exaly  

In situ visualization of Li concentration in all-solid-state lithium ion batteries using time-of-flight secondary ion mass spectrometry

Journal of Power Sources, 2018
Hideki Masuda, Nobuyuki Ishida, Daisuke Fujita   +2 more
exaly  

A novel method to understand and quantify silicate tetrahedron in C-S-H by time of flight secondary ion mass spectrometry analysis

Cement and Concrete Composites
Zheyu Zhu, ZhongPing Wang, Yun Gao
exaly  

Characterization of carbon and carbon nitride thin films using time-of-flight secondary-ion-mass spectrometry

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 1997
L J Huang, G R Massoumi, W N Lennard
exaly  

Surface and trace analysis by high‐resolution time‐of‐flight secondary ion mass spectrometry

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 1989
exaly  

15.22 - Time-of-Flight Secondary Ion Mass Spectrometry, Secondary Neutral Mass Spectrometry, and Resonance Ionization Mass Spectrometry

2014
Henkel, T, Gilmour, Jamie
openaire   +2 more sources

Maximum likelihood principal component analysis of time-of-flight secondary ion mass spectrometry spectral images

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 2005
exaly  

Advanced time-of-flight secondary ion mass spectrometry analyses for application to TFT-LCD

Materials Science in Semiconductor Processing, 2001
exaly