Results 241 to 250 of about 166,663,679 (286)

Time-of-Flight Secondary Ion Mass Spectrometry

2008
Static secondary ion mass spectrometry provides information on the molecular composition of the topmost layer of a sample. It is mostly used as a complementary technique to determine surface composition, surface contamination or surface segregation of components.
Dieter Pleul, Frank Simon
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Time-of-flight secondary ion mass spectrometry of fullerenes

European Journal of Mass Spectrometry, 1995
High performance time-of-flight secondary ion mass spectrometry (TOF-SIMS) characterised by high mass resolution and extreme sensitivity has been applied to the analysis of fullerenes. Optimum emission of secondary ions is obtained from silver substrates covered by approximately one monolayer of fullerene. Besides the intact cluster ions C60+, C70+ and
F. Saldi, Y. Marie, Y. Gao, C. Simon, H. Migeon, D. Bégin, J. Marêché   +6 more
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A pulsed time‐of‐flight mass spectrometer for liquid secondary ion mass spectrometry

Rapid Communications in Mass Spectrometry, 1988
Abstract The design and performance of a new time‐of‐flight mass spectrometer is reported. The instrument combines the advantages of a pulsed drawout TOF analyzer with a liquid secondary ion source. Differences from commercially available pulsed TOF analyzers (Wiley/McLaren type) are discussed with regard to operation with ion ...
J K, Olthoff, I A, Lys, R J, Cotter
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Postacquisition Mass Resolution Improvement in Time-of-Flight Secondary Ion Mass Spectrometry

Analytical Chemistry, 2012
Good mass resolution can be difficult to achieve in time-of-flight secondary ion mass spectrometry (TOF-SIMS) when the analysis area is large or when the surface being analyzed is rough. In most cases, a significant improvement in mass resolution can be achieved by postacquisition processing of raw data.
Steven J, Pachuta, Paul R, Vlasak
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Identification of human calculi with time‐of‐flight secondary ion mass spectrometry

Rapid Communications in Mass Spectrometry, 2009
Abstract Time‐of‐flight secondary ion mass spectrometry was used to study four human calculi and to compare the results with those from twelve commercially available urinary calculi minerals including three organic compounds (L‐cystine, uric acid and sodium urate).
C Amjad A, Ghumman, Olga M T, Carreira, Augusto M C, Moutinho, Alexander, Tolstogouzov, Valentina, Vassilenko, Orlando M N D, Teodoro   +5 more
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Lipid imaging with cluster time-of-flight secondary ion mass spectrometry

Analytical and Bioanalytical Chemistry, 2008
This brief article provides an overview of the current state of the art in biological imaging mass spectrometry using cluster time-of-flight secondary ion mass spectrometry (TOF-SIMS). Recent and spectacular improvements in terms of sensitivity of TOF-SIMS imaging methods have allowed many biological applications to recently be successfully tested ...
Brunelle, Alain, Laprévote, Olivier
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Protein Denaturation Detected by Time-of-Flight Secondary Ion Mass Spectrometry

Langmuir, 2011
In the present work we investigate the denaturation of a functional protein, horseradish peroxidase (HRP), under various experimental conditions using time-of-flight secondary ion mass spectrometry. HRP was immobilized on TiO(2), and the samples were stored under different conditions.
Manuela S, Killian, Heike M, Krebs, Patrik, Schmuki   +2 more
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Time-of-Flight Measurements in Secondary Ion Mass Spectrometry

1986
In recent years a number of mass spectrometers have been constructed for measuring the mass spectra of secondary ions by time-of-flight methods [1]. References The secondary ions may be produced by bombardment of the sample with high energy (MeV) primary ions [2] or with low-energy (keV) ions.
K. G. Standing, R. Beavis, G. Bolbach, W. Ens, D. E. Main, B. Schueler   +5 more
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Secondary Ion Mass Spectrometry and Time-of-Flight Secondary Ion Mass Spectrometry Study of Impurity Measurements in HgCdTe

Journal of Electronic Materials, 2007
In this study, time-of-flight (TOF) secondary ion mass spectrometry (SIMS) was compared against dynamic SIMS to determine detection limits and background levels for nine impurities: Li, Na, K, Al, Ni, As, In, Fe, and Cu. Statistics were gathered by measuring six material test structure samples from six different liquid phase epitaxy (LPE) HgCdTe double
Steve Price, Larry Wang, Alice Wang, Arwa Ginwalla, Ian Mowat   +4 more
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Ion-to-neutral conversion in time-of-flight secondary ion mass spectrometry

Applied Surface Science, 2003
Abstract Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was used to explore ion-to-neutral conversion on a microsecond time scale. A membrane lipid served as a sample. Neutrals generated from positive ions exhibited rather broad lines in the TOF spectrum, indicating significant transfer of kinetic energy during fragmentation.
W. Szymczak, K. Wittmaack
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