Results 241 to 250 of about 76,098 (279)

Identification of human calculi with time‐of‐flight secondary ion mass spectrometry

Rapid Communications in Mass Spectrometry, 2009
Abstract Time‐of‐flight secondary ion mass spectrometry was used to study four human calculi and to compare the results with those from twelve commercially available urinary calculi minerals including three organic compounds (L‐cystine, uric acid and sodium urate).
C Amjad A, Ghumman, Olga M T, Carreira, Augusto M C, Moutinho, Alexander, Tolstogouzov, Valentina, Vassilenko, Orlando M N D, Teodoro   +5 more
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Protein Denaturation Detected by Time-of-Flight Secondary Ion Mass Spectrometry

Langmuir, 2011
In the present work we investigate the denaturation of a functional protein, horseradish peroxidase (HRP), under various experimental conditions using time-of-flight secondary ion mass spectrometry. HRP was immobilized on TiO(2), and the samples were stored under different conditions.
Manuela S, Killian, Heike M, Krebs, Patrik, Schmuki   +2 more
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Secondary Ion Mass Spectrometry and Time-of-Flight Secondary Ion Mass Spectrometry Study of Impurity Measurements in HgCdTe

Journal of Electronic Materials, 2007
In this study, time-of-flight (TOF) secondary ion mass spectrometry (SIMS) was compared against dynamic SIMS to determine detection limits and background levels for nine impurities: Li, Na, K, Al, Ni, As, In, Fe, and Cu. Statistics were gathered by measuring six material test structure samples from six different liquid phase epitaxy (LPE) HgCdTe double
Steve Price, Larry Wang, Alice Wang, Arwa Ginwalla, Ian Mowat   +4 more
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Ion-to-neutral conversion in time-of-flight secondary ion mass spectrometry

Applied Surface Science, 2003
Abstract Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was used to explore ion-to-neutral conversion on a microsecond time scale. A membrane lipid served as a sample. Neutrals generated from positive ions exhibited rather broad lines in the TOF spectrum, indicating significant transfer of kinetic energy during fragmentation.
W. Szymczak, K. Wittmaack
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Time-of-Flight Secondary Ion Mass Spectrometry

2018
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is one of the most powerful surface analysis methods in terms of high sensitivity, high spatial resolution imaging, and detailed chemical information.
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Time-of-Flight Measurements in Secondary Ion Mass Spectrometry

1986
In recent years a number of mass spectrometers have been constructed for measuring the mass spectra of secondary ions by time-of-flight methods [1]. References The secondary ions may be produced by bombardment of the sample with high energy (MeV) primary ions [2] or with low-energy (keV) ions.
K. G. Standing, R. Beavis, G. Bolbach, W. Ens, D. E. Main, B. Schueler   +5 more
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Time-of-flight secondary ion mass spectrometry of polymer materials

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1989
Secondary ion formation from polystyrene standards with well-defined molecular weight distributions between 103 and 106 amu has systematically been investigated. Maximum yields of cationized fragments and oligomers are obtained from silver substrates covered by about one monolayer of polymer material. Intact oligomers of polystyrene are detected in the
D. van Leyen, B. Hagenhoff, E. Niehuis, A. Benninghoven, I. V. Bletss, D. M. Hercules   +5 more
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Characterization of adsorbed protein films by time of flight secondary ion mass spectrometry

Journal of Biomedical Materials Research, 2001
Time of flight secondary ion mass spectrometry (ToF-SIMS) is a useful technique in the study of adsorbed protein films because of its high surface sensitivity and chemical selectivity. However, the protein mass spectra generated by ToF-SIMS are complex fragmentation patterns of a polymer consisting of 20 different monomers (i.e., amino acids ...
J B, Lhoest, M S, Wagner, C D, Tidwell, D G, Castner   +3 more
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Introduction to time-of-flight secondary ion mass spectrometry application in chromatographic analysis

Journal of Chromatography A, 2005
New on-line analytical system coupling thin layer chromatography (TLC) and high selective identification unit-time of flight secondary ion mass spectrometry (TOF-SIMS) is introduced in this article. Chromatographic mixture separation and analyte surface deposition followed with surface TOF-SIMS analysis on-line allows to identify the analytes at trace ...
Andrej, Orinák, Heinrich F, Arlinghaus, Guido, Vering, Renáta, Orináková, Sebastian, Hellweg   +4 more
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Characterization of combinatorially designed polyarylates by time-of-flight secondary ion mass spectrometry

Rapid Communications in Mass Spectrometry, 2000
A series of 16 polyarylates, with well-controlled and systematically varying chemistry, has been characterized by time-of-flight secondary ion mass spectrometry (TOF-SIMS). The polymers are structurally identical except for the incremental additions of C2H4 units to the backbone and sidechain.
A M, Belu, S, Brocchini, J, Kohn, B D, Ratner   +3 more
openaire   +2 more sources