Results 151 to 154 of about 558 (154)
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Total Ionizing Dose (TID) Analysis of FinFET-Based CMOS NAND and NOR Logic Gates
2025 Devices for Integrated Circuit (DevIC)Abhishek Ray +2 more
openaire +1 more source
Research on Combinatorial Feature of Total Ionizing Dose (TID) Effect on Interconnect
Advances in Intelligent Systems and Computing, 2020exaly
Impact of TID on the Transient Ionizing Irradiation Response of CMOS Circuits
2018He Chaohui, Qi Chao
exaly
Total Ionizing Dose Effects in Advanced 28 nm Charge Trapping 3D NAND Flash Memory
Electronics (Switzerland)Mingxue Huo
exaly