Results 191 to 193 of about 8,141,274 (193)

Total Ionizing Dose (TID) Analysis of FinFET-Based CMOS NAND and NOR Logic Gates

2025 Devices for Integrated Circuit (DevIC)
Abhishek Ray, Aashutosh Jaiswal, Guru Prasad Mishra   +2 more
openaire   +1 more source

Impact of TID on the Transient Ionizing Irradiation Response of CMOS Circuits

2018
Chenhui Wang, Ruibin Li, Shanchao Yang
exaly  

Modeling of Total Ionizing Dose (TID) Effects on the Nonuniform Distribution of Si/SiO2 Interface Trap Energy States in MOS Devices

Scientific Reports
exaly