Results 121 to 130 of about 149,459 (248)

Origin of Threshold Voltage Instabilities in Indium Oxide Transistors. [PDF]

ACS Appl Mater Interfaces
Lin TJ, Chen SC, Lee YT, Cheng SL, Tseng R, Wang ST, Chang YC, Pan YY, Chang CY, Chou TT, Lin CH, Ku CS, Lin CL, Liu PT, Kim H, Lien DH.   +15 more
europepmc   +1 more source

Enhancing Discharge Performance and Image Lag Characteristics in PIN Diode X-Ray Sensors with a Reset Transistor. [PDF]

Sensors (Basel)
Jang H, Heo J, Bok M, Lim E.
europepmc   +1 more source

Self-Powered Neuromorphic Touch Sensors Based on Triboelectric Devices: Current Approaches and Open Challenges. [PDF]

Small
Torricelli F, Pace G.
europepmc   +1 more source

Basic studies for THz imaging sensors using organic field effect transistors

, 2013
世光 李, セコウ リ, Shiguang Li
openalex   +1 more source

Analog Signal Summation for Reinforcement Learning via Simultaneous Light-Voltage Modulation in a Synaptic Device. [PDF]

Adv Sci (Weinh)
Roe DG, Cheon S, Im S, Choi S, Kim M, Kim S, Yoo Y, Kim JW, Ju H, Jeong S, Cho JH.   +10 more
europepmc   +1 more source

Mechanism of Current Gain increase of Heterostructure Bipolar Transistors Passivated by Low-Temperature Deposited SiNx [PDF]

, 2003
Zhiyang Jin, S. Neumann, W. Prost, F.‐J. Tegude   +3 more
openalex   +1 more source

Microfibrillated Cellulose Embedded with KCl as a Solid-Dopant Matrix into an Electrolyte-Gated Transistor. [PDF]

ACS Omega
Bettega R, Lucizani AC, Jasper I, Magalhães WLE, Vidotti M, Seidel KF, Serbena JPM.   +6 more
europepmc   +1 more source

Spin-coupled double-quantum-dot behavior inside a single-molecule transistor [PDF]

, 2010
Anne Bernand-Mantel, Johannes S. Seldenthuis, Arjan J. A. Beukman, Herre S. J. van der Zant, Velimir Meded, R. Chandrasekhar, Karin Fink, Mario Ruben, Ferdinand Evers   +8 more
openalex   +1 more source

Total Ionizing Dose Effect Simulation Study on 130 nm CMOS Processor. [PDF]

Micromachines (Basel)
Liu Y, Liu Y, Liao X, Xu C, He Y, Yang Y.   +5 more
europepmc   +1 more source

Cross Comparison Between Thermal Cycling and High Temperature Stress on I/O Connection Elements. [PDF]

Micromachines (Basel)
Dhyani M, Avraham T, Bernstein JB, Bender E.   +3 more
europepmc   +1 more source