Results 11 to 20 of about 24 (22)
Some of the next articles are maybe not open access.
Crosstalk Analysis for Different Types of PCB VIAS Models at High-Frequency Transmission
SpringerBriefs in Applied Sciences and Technology, 2023exaly
High aspect ratio copper through-silicon-vias for 3D integration
Microelectronic Engineering, 2008Zheyao Wang, Jian Cai
exaly
Electromigration reliability of tungsten and aluminum vias and improvements under AC current stress
IEEE Transactions on Electron Devices, 1993N W Cheung
exaly
Novel Photo-Defined Polymer-Enhanced Through-Silicon Vias for Silicon Interposers
IEEE Transactions on Components, Packaging and Manufacturing Technology, 2013Paragkumar Thadesar
exaly
Reliability challenges for barrier/liner system in high aspect ratio through silicon vias
Microelectronics Reliability, 2014Eric Beyne +2 more
exaly
Electromigration Study for Multiscale Power/Ground Vias in TSV-Based 3-D ICs
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2014David Z Pan, Sung Kyu Lim
exaly

