Results 271 to 280 of about 120,440 (291)

Reducing the fluid fluctuation of three-cylinder ERD by optimizing the overlap function and improving the resistance loss uniformity

Desalination, 2021
Yue Wang, Shichang Xu
exaly  

Deep Learning Approach to Estimating Work Function Fluctuation of Gate-All-Around Silicon Nanosheet MOSFETs with A Ferroelectric HZO Layer

2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 2022
Rajat Butola, Yiming Li, Sekhar Reddy Kola   +2 more
openaire   +1 more source

Intelligent Modeling of Electrical Characteristics of Multi-Channel Gate All Around Silicon Nanosheet MOSFETs Induced by Work Function Fluctuation

2022 IEEE 22nd International Conference on Nanotechnology (NANO), 2022
Chandni Akbar, Yiming Li, Wen-Li Sung
openaire   +1 more source

Statistical simulation of metal-gate work-function fluctuation in high-κ/metal-gate devices

2010 International Conference on Simulation of Semiconductor Processes and Devices, 2010
Chia-Hui Yu, Ming-Hung Han, Hui-Wen Cheng, Zhong-Cheng Su, Yiming Li, Hiroshi Watanabe   +5 more
openaire   +1 more source

A Nanosized-Metal-Grain Pattern-Dependent Model for Work-Function Fluctuation of Gate-All-Around Silicon Nanofin and Nanosheet MOSFETs

2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA), 2022
Wen-Li Sung, Yiming Li
openaire   +1 more source

Wind power scenario generation with non-separable spatio-temporal covariance function and fluctuation-based clustering

International Journal of Electrical Power and Energy Systems, 2021
Jin Tan, Qiuwei Wu, Menglin Zhang
exaly  

Influence of work function variation in a metal gate on fluctuation of current-onset voltage for undoped-channel FinFETs

Extended Abstracts of the 2013 International Conference on Solid State Devices and Materials, 2015
T. Matsukawa, Y.X. Liu, K. Endo, J. Tsukada, H. Yamauchi, Y. Ishikawa, S. O'uchi, W. Mizubayashi, H. Ota, S. Migita, Y. Morita, M. Masahara   +11 more
openaire   +1 more source

3D device simulation of work function and interface trap fluctuations on high-κ / metal gate devices

2010 International Electron Devices Meeting, 2010
null Hui-Wen Cheng, null Fu-Hai Li, null Ming-Hung Han, null Chun-Yen Yiu, null Chia-Hui Yu, null Kuo-Fu Lee, Yiming Li   +6 more
openaire   +1 more source

Work-function variation induced fluctuation in bias-temperature-instability characteristics of emerging metal-gate devices and implications for digital design

2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2010
Seid Hadi Rasouli, Kazuhiko Endo, Kaustav Banerjee   +2 more
openaire   +1 more source

Evaluation of the scale of fluctuation of geotechnical parameters by autocorrelation function and semivariogram function

Engineering Geology, 2016
Site Onyejekwe, Xin Kang, Louis Ge
exaly