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Some of the next articles are maybe not open access.
Improving the Reliability of Chip-Off Forensic Analysis of NAND Flash Memory Devices
Digital Investigation, 2017Onur Mutlu, Yixin Luo, Aya Fukami
exaly
Reliability of Solid-State Drives Based on NAND Flash Memory
Proceedings of the IEEE, 2017Neal R Mielke, Ivan Kalastirsky
exaly
Natural Local Self-Boosting Effect in 3D NAND Flash Memory
IEEE Electron Device Letters, 2017Yoon Kim, Myounggon Kang
exaly
Analysis on Heterogeneous SSD Configuration With Quadruple-Level Cell (QLC) NAND Flash Memory
2019Ken Takeuchi, Chihiro Matsui
exaly
Gate Side Injection Operating Mode for 3D NAND Flash Memories
2024 IEEE International Memory Workshop (IMW)Laurent Breuil +8 more
openaire +1 more source

