Results 161 to 168 of about 485 (168)
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Cryogenic Investigation of Vertical Charge Loss in 3D NAND Flash Memories

2025 IEEE International Reliability Physics Symposium (IRPS)
D. G. Refaldi   +5 more
openaire   +1 more source

Achieving Near-Zero Read Retry for 3D NAND Flash Memory

Proceedings of the 29th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, Volume 2
Min Ye   +7 more
openaire   +2 more sources

Retention Improvement in Vertical NAND Flash Memory Using Electron Back-Tunneling

IEEE Electron Device Letters
Jongwon Back, Ho-Nam Yoo, Jong-Ho Lee
exaly  

Material engineering to enhance reliability in 3D NAND flash memory

Device
Ki Han Kim   +9 more
openaire   +1 more source

A METHOD FOR FORMING A MEMORY STRUCTURE FOR A 3D NAND FLASH MEMORY

RACHIDI SANA   +3 more
openaire   +1 more source

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