Results 161 to 168 of about 485 (168)
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Cryogenic Investigation of Vertical Charge Loss in 3D NAND Flash Memories
2025 IEEE International Reliability Physics Symposium (IRPS)D. G. Refaldi +5 more
openaire +1 more source
Achieving Near-Zero Read Retry for 3D NAND Flash Memory
Proceedings of the 29th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, Volume 2Min Ye +7 more
openaire +2 more sources
Retention Improvement in Vertical NAND Flash Memory Using Electron Back-Tunneling
IEEE Electron Device LettersJongwon Back, Ho-Nam Yoo, Jong-Ho Lee
exaly
Material engineering to enhance reliability in 3D NAND flash memory
DeviceKi Han Kim +9 more
openaire +1 more source
A METHOD FOR FORMING A MEMORY STRUCTURE FOR A 3D NAND FLASH MEMORY
RACHIDI SANA +3 moreopenaire +1 more source

