Results 61 to 70 of about 537 (109)

Cross-architecture tuning of silicon and SiGe-based quantum devices using machine learning. [PDF]

Sci Rep
Severin B, Lennon DT, Camenzind LC, Vigneau F, Fedele F, Jirovec D, Ballabio A, Chrastina D, Isella G, de Kruijf M, Carballido MJ, Svab S, Kuhlmann AV, Geyer S, Froning FNM, Moon H, Osborne MA, Sejdinovic D, Katsaros G, Zumbühl DM, Briggs GAD, Ares N.   +21 more
europepmc   +2 more sources

Development and Performance Analysis of High-K Spacer-Induced Strained Si/SiGe Channel-Based Gate All Around FET for Thermal Effects. [PDF]

Nanomaterials (Basel)
Yugender P, Singh S, Kumar K, Dhar RS, Seteikin AY, Banerjee A, Samusev IG.   +6 more
europepmc   +1 more source

Enhanced Drive Current in 10 nm Channel Length Gate-All-Around Field-Effect Transistor Using Ultrathin Strained Si/SiGe Channel. [PDF]

Micromachines (Basel)
Yugender P, Dhar RS, Nanda S, Kumar K, Sakthivel P, Thirumurugan A.   +5 more
europepmc   +1 more source

Comprehensive Review of FinFET Technology: History, Structure, Challenges, Innovations, and Emerging Sensing Applications. [PDF]

Micromachines (Basel)
Karimi K, Fardoost A, Javanmard M.
europepmc   +1 more source

Dual-directional CIM-based non-volatile SRAM for instant-on/off energy-constrained edge AI devices. [PDF]

Sci Rep
Hemmasi SP, Moaiyeri MH, Eslami N, Ebrahimi B.   +3 more
europepmc   +1 more source

Remarkably High Effective Mobility of 301 cm²/V·s in 3 nm Ultra-Thin-Body SnO₂ Transistor by UV Annealing. [PDF]

Nanomaterials (Basel)
Shih AC, Zhan YH, Chin A.
europepmc   +1 more source

Effect of C₂H₂F₄/CF₄O with low global warming potentials on SiN_x etching as a CHF₃ replacement. [PDF]

Sci Rep
Kim KL, Hong JW, Jeon YW, Jeong JW, Kim CH, Eoh HJ, Kim SH, Park JS, Cho NI, Kwak JH, Kim Y, Yeom GY.   +11 more
europepmc   +1 more source

Epitaxial Mixed-Dimensional MoS₂ Nanofin-Nanoribbon Hybrids and Their Integration into Electronic and Optoelectronic Devices. [PDF]

ACS Appl Mater Interfaces
Danieli Y, Houben L, Rechav K, Brontvein O, Kaplan-Ashiri I, Pinkas I, Vilan A, Joselevich E.   +7 more
europepmc   +1 more source

An Overview of Hot Carrier Degradation on Gate-All-Around Nanosheet Transistors. [PDF]

Micromachines (Basel)
Zhou H.
europepmc   +1 more source

Sub-THz communication systems: pushing the capabilities of silicon. [PDF]

Commun Eng
Gruber J, Alotaibi H, Tabatabavakili A, Chen L, Aghasi H, Naghavi SMH, Afshari E.   +6 more
europepmc   +1 more source