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Charge trapping induced electromechanical energy
Journal of Applied Physics, 1996The electromechanical energy stored in a dielectric subjected to the field of a trapped charge is calculated by a self-consistent method, using a point-dipole model for the polarization. The magnitude of this energy is 5–10 eV per trapped charge, depending on the structure (fcc or bcc) and the location of the charge (atomic site or intersite).
C. Coudray, G. Blaise
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Trapped Charge Dating Techniques
2010Thermoluminescence (TL), optically stimulated luminescence (OSL), and electron spin resonance (ESR) are all trapped charge dating techniques. These techniques use signals arising from electrons trapped in the crystalline structure of a sample to calculate the time since the traps were empty. For TL and OSL, the population of trapped charges is measured
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Charge trapping in MOS systems
Thin Solid Films, 1972Abstract Measurements on MOS capacitors and MOS transistors at room temperature and 77 K lead to the conclusion that large slow-trapping effects can occur at the Si-SiO 2 interface at room temperature. These “slow state” effects differ substantially from the “slow state” effects usually observed in the Si-SiO 2 system.
D.J. Breed, R.P. Kramer
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2010
In the last years a big research effort has been spent in the study of new technologies that could represent a possible alternative to conventional floating gate (FG) NAND. In fact even if FG NAND is the dominant technology and there is no advice of reduction in scaling pace, several physical roadblocks seem to limit future scalability (e.g ...
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In the last years a big research effort has been spent in the study of new technologies that could represent a possible alternative to conventional floating gate (FG) NAND. In fact even if FG NAND is the dominant technology and there is no advice of reduction in scaling pace, several physical roadblocks seem to limit future scalability (e.g ...
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Charge trapping in organic polymers
International Journal of Radiation Applications and Instrumentation. Part C. Radiation Physics and Chemistry, 1990Abstract Present day knowledge of charge carrier trapping in organic polymers is reviewed, drawing mainly on thermally stimulated luminescence and conductivity data.
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Excitations, charge transfer and trapping
AIP Conference Proceedings, 1991There are three themes in my talk. In the first one, I discuss recent work on the transport of epithermal positrons across overlayers on metallic substrates. The second theme deals with the question of positronium formation and breakup at metallic surfaces.
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Trapped highly charged ion plasmas
AIP Conference Proceedings, 2002Electron Beam Ion Trap (EBIT) devices and their special features are reviewed with attention to applications in highly charged ion plasma research. EBIT properties are presented based on information extracted from a variety of experiments reported in the literature. Topics discussed include typical parameters (Debye length, Wigner-Seitz radius, Coulomb
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