Results 111 to 120 of about 106,345 (262)
A New Embedded Measurement Structure for eDRAM Capacitor
Submitted on behalf of EDAA (http://www.edaa.com/)International audienceThe embedded DRAM (eDRAM) is more and more used in System On Chip (SOC). The integration of the DRAM capacitor process into a logic process is challenging to get satisfactory yields.
Lopez, L., Nee, D., Portal, Jean-Michel
core +1 more source
ProTRR: Principled yet Optimal In-DRAM Target Row Refresh
Michele Marazzi +3 more
openalex +2 more sources
Drams: Double-Ris Assisted Multihop Routing Scheme for Wireless Networks
Lakshmikanta Sau +2 more
openalex +1 more source
DRAMSys: A Flexible DRAM Subsystem Design Space Exploration Framework
Matthias Jung +2 more
openalex +2 more sources
A Framework for Formal Verification of DRAM Controllers [PDF]
Lukas Steiner +4 more
openalex +1 more source
Nonlinear Variation Decomposition of Neural Networks for Holistic Semiconductor Process Monitoring
Artificial intelligence (AI) is increasingly used to solve multi‐objective problems and reduce the turnaround times of semiconductor processes. However, only brief AI explanations are available for process/device/circuit engineers to provide holistic ...
Hyeok Yun +11 more
doaj +1 more source
Optimization of Capacitor Threshold VTImplantation for Planar P-MOS DRAM Cell
openalex +2 more sources
DRAM-Profiler: An Experimental DRAM RowHammer Vulnerability Profiling Mechanism
RowHammer stands out as a prominent example, potentially the pioneering one, showcasing how a failure mechanism at the circuit level can give rise to a significant and pervasive security vulnerability within systems. Prior research has approached RowHammer attacks within a static threat model framework.
Zhou, Ranyang +5 more
openaire +2 more sources
Increasing the Profit of Cloud Providers through DRAM Operation at Reduced Margins
Christos Kalogirou +5 more
openalex +2 more sources

