Results 141 to 150 of about 609 (176)
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Electrostatic Discharge (ESD) Susceptibility of Electronic Devices
1983Abstract : This book contains data on the electrostatic discharge susceptibility (ESD) of electronic devices. Detailed susceptibility data is presented along with the ESD classification in accordance with DOD-HDBK-263 for approximately 700 microcircuits and 500 discrete semiconductor devices.
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Methodology to simulate speed of approach in electrostatic discharge (ESD)
Proceedings Electrical Overstress/Electrostatic Discharge Symposium, 1997Electrostatic discharge (ESD) is a charge driven phenomenon. As a body with fixed charge approaches another conductor, system capacitance coefficients and body potentials are altered; a discharge occurs if the electric field between the two bodies exceeds the critical breakdown strength of air for the defined geometry.
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Investigation of electrostatic discharge (ESD) for a three body problem with small gaps
Conference Record of the 2004 IEEE Industry Applications Conference, 2004. 39th IAS Annual Meeting., 2004An experimental investigation of indirect electrostatic discharge (ESD) events for an inline three-body geometry was undertaken. Using conducting cylinders of different sizes to model the test system's conductors, capacitance coefficients were measured; body potential differences and electric fields in air gaps were calculated for different geometries ...
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Electrostatic discharge (ESD) sensitivity of thin-film hybrid passive components
IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1989The electrostatic discharge (ESD) sensitivities of thin-film passive components from various hybrid integrated circuits were characterized using two models: the human body model (HBM) and the charge device model (CDM). It was found that thin-film Au conductors made with a minimum linewidth of 60 mu m were insensitive to ESD of 3000 V. Capacitors failed
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1998 IEEE International Integrated Reliability Workshop Final Report (Cat. No.98TH8363), 1998
H. Gieser, E. Worley
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H. Gieser, E. Worley
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Electrostatic Discharge (ESD) Failure Rate Prediction
1984 International Symposium on Electromagnetic Compatibility, 1984Daniel J. Pratt, James H. Davis
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