Results 141 to 150 of about 609 (176)
Some of the next articles are maybe not open access.

Electrostatic Discharge (ESD) Susceptibility of Electronic Devices

1983
Abstract : This book contains data on the electrostatic discharge susceptibility (ESD) of electronic devices. Detailed susceptibility data is presented along with the ESD classification in accordance with DOD-HDBK-263 for approximately 700 microcircuits and 500 discrete semiconductor devices.
openaire   +1 more source

Methodology to simulate speed of approach in electrostatic discharge (ESD)

Proceedings Electrical Overstress/Electrostatic Discharge Symposium, 1997
Electrostatic discharge (ESD) is a charge driven phenomenon. As a body with fixed charge approaches another conductor, system capacitance coefficients and body potentials are altered; a discharge occurs if the electric field between the two bodies exceeds the critical breakdown strength of air for the defined geometry.
openaire   +1 more source

Investigation of electrostatic discharge (ESD) for a three body problem with small gaps

Conference Record of the 2004 IEEE Industry Applications Conference, 2004. 39th IAS Annual Meeting., 2004
An experimental investigation of indirect electrostatic discharge (ESD) events for an inline three-body geometry was undertaken. Using conducting cylinders of different sizes to model the test system's conductors, capacitance coefficients were measured; body potential differences and electric fields in air gaps were calculated for different geometries ...
openaire   +1 more source

Electrostatic discharge (ESD) sensitivity of thin-film hybrid passive components

IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1989
The electrostatic discharge (ESD) sensitivities of thin-film passive components from various hybrid integrated circuits were characterized using two models: the human body model (HBM) and the charge device model (CDM). It was found that thin-film Au conductors made with a minimum linewidth of 60 mu m were insensitive to ESD of 3000 V. Capacitors failed
openaire   +1 more source

Electrostatic Discharge - ESD

1998 IEEE International Integrated Reliability Workshop Final Report (Cat. No.98TH8363), 1998
H. Gieser, E. Worley
openaire   +1 more source

Electrostatic Discharge (ESD) as a Cause of Facial Nerve Stimulation After Cochlear Implantation: A Case Report

Annals of Otology, Rhinology and Laryngology, 2022
Smruti Rath   +2 more
exaly  

On-chip electrostatic discharge ESD

Microelectronics Reliability, 2003
openaire   +1 more source

Electrostatic Discharge (ESD) Failure Rate Prediction

1984 International Symposium on Electromagnetic Compatibility, 1984
Daniel J. Pratt, James H. Davis
openaire   +1 more source

Home - About - Disclaimer - Privacy