Results 181 to 187 of about 751 (187)
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Reliable Operation of FeFET Reservoir Computing With Robustness Against Interface Degradation

IEEE Transactions on Electron Devices
Eishin Nako   +2 more
exaly  

Charge trapping challenges of CMOS embedded complementary FeFETs

2024 IEEE International Memory Workshop (IMW)
Sven Beyer   +9 more
openaire   +1 more source

Origin of charges in bulk Si:HfO2 FeFET probed by nanosecond polarization measurements

Microelectronic Engineering
Mor M Dahan   +2 more
exaly  

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