Results 181 to 187 of about 751 (187)
Some of the next articles are maybe not open access.
Reliable Operation of FeFET Reservoir Computing With Robustness Against Interface Degradation
IEEE Transactions on Electron DevicesEishin Nako +2 more
exaly
Charge trapping challenges of CMOS embedded complementary FeFETs
2024 IEEE International Memory Workshop (IMW)Sven Beyer +9 more
openaire +1 more source
Origin of charges in bulk Si:HfO2 FeFET probed by nanosecond polarization measurements
Microelectronic EngineeringMor M Dahan +2 more
exaly
A Review on Recent Breakthroughs and Accomplishments in the Development of FeFET
B. Vimala Reddy +2 moreopenaire +1 more source

