Results 81 to 90 of about 264,240 (179)

Smart Electrical Screening Methodology for Channel Hole Defects of 3D Vertical NAND (VNAND) Flash Memory

Eng
In order to successfully achieve mass production in NAND flash memory, a novel test procedure has been proposed to electrically detect and screen the channel hole defects, such as Not-Open, Bowing, and Bending, which are unique in high-density 3D NAND ...
Beomjun Kim, Gyeongseob Seo, Myungsuk Kim   +2 more
doaj   +1 more source

Constant-Weight Gray Codes for Local Rank Modulation

, 2010
We consider the local rank-modulation scheme in which a sliding window going over a sequence of real-valued variables induces a sequence of permutations.
Schwartz, Moshe
core   +1 more source

Flash Memory ‘Bumping’ Attacks [PDF]

, 2010
This paper introduces a new class of optical fault injection attacks called bumping attacks. These attacks are aimed at data extraction from secure embedded memory, which usually stores critical parts of algorithms, sensitive data and cryptographic keys.
openaire   +1 more source

A Novel Program Scheme for Z-Interference Improvement in 3D NAND Flash Memory. [PDF]

Micromachines (Basel), 2023
Jia J, Jin L, Jia X, You K.
europepmc   +1 more source

Effects of Poly-Si Grain Boundary on Retention Characteristics under Cross-Temperature Conditions in 3-D NAND Flash Memory. [PDF]

Micromachines (Basel), 2023
An U, Yoon G, Go D, Park J, Kim D, Kim J, Lee JS.   +6 more
europepmc   +1 more source

Investigation of Erase Cycling Induced Joint Dummy Cell Disturbance in Dual-Deck 3D NAND Flash Memory. [PDF]

Micromachines (Basel), 2023
You K, Jin L, Jia J, Huo Z.
europepmc   +1 more source

Design Strategies of 40 nm Split-Gate NOR Flash Memory Device for Low-Power Compute-in-Memory Applications. [PDF]

Micromachines (Basel), 2023
Yook CG, Kim JN, Kim Y, Shim W.
europepmc   +1 more source

Editorial for the Special Issue on Flash Memory Devices. [PDF]

Micromachines (Basel), 2021
Zambelli C, Micheloni R.
europepmc   +1 more source

Leveraging the page buffer data cache for enhanced programmability in NAND flash memories with on‐chip microcontrollers

Electronics Letters
This paper proposes a simple yet effective scheme for NAND Flash memories that employ on‐chip microcontroller units (MCUs) to manage internal array operations.
Geonu Kim
doaj   +1 more source

Highly Efficient Built-In Self-Repair Techniques for NAND Flash Memory With Fine-Grained Redundancies

IEEE Access
Owing to the inherent architecture of NAND flash memory, the widely used redundant mechanisms for replacing faulty cells are limited to spare blocks and spare columns.
Shyue-Kung Lu, Shih-Chun Tseng, Kohei Miyase   +2 more
doaj   +1 more source