Results 271 to 280 of about 12,503,659 (299)
Some of the next articles are maybe not open access.

Scaling opportunities for Gate-All-Around: A patterning perspective

2023 International Electron Devices Meeting (IEDM), 2023
I. Seshadri   +13 more
openaire   +1 more source

p-GaN Gate HEMT With Surface Reinforcement for Enhanced Gate Reliability

IEEE Electron Device Letters, 2021
Li Zhang, Zheyang Zheng, Song Yang
exaly  

Top‐Gate Organic Field‐Effect Transistors with High Environmental and Operational Stability

Advanced Materials, 2011
Do Kyung Hwang   +2 more
exaly  

Gate-all-around FETs

Yogesh Singh Chauhan   +10 more
openaire   +1 more source

Electrical properties of high-κ gate dielectrics: Challenges, current issues, and possible solutions

Materials Science and Engineering Reports, 2006
M Houssa   +2 more
exaly  

Some Properties of SOI Gate-All-Around Devices

Extended Abstracts of the 1994 International Conference on Solid State Devices and Materials, 1994
P. Francis, X. Baie, J. P. Colinge
openaire   +1 more source

p-GaN Gate HEMTs With Tungsten Gate Metal for High Threshold Voltage and Low Gate Current

IEEE Electron Device Letters, 2013
Injun Hwang, Jongseob Kim, Jaejoon Oh
exaly  

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