Analysis of floating body effects in thin film SOI MOSFETs using the GIDL current technique
, 2001 In this paper, we present an analysis of floating body effects in lateral asymmetric channel (LAC) and conventional homogeneously doped channel (uniform) SOI MOSFETs using a novel gate-induced-drain-leakage (GIDL) current technique. The parasitic bipolar
AATISH KUMAR +5 more
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The Effect of Gate-Induced Drain Leakage (GIDL) on Scaled MOSFETS of Low Power Consumptions [PDF]
, 2017 This project is aimed to study the impact of GateInduced Drain Leakage (GIDL) on scaled Metal-OxideSemiconductor Field-Effect Transistor (MOSFET) for low power efficient application. The MOSFET is operated with low power consumption. Microchip industries
Hassan, Nornikman; Faculty of Electronics and Computer Engineering (FKEKK), Universiti Teknikal Malaysia Melaka, Hang Tuah Jaya, 76100 Durian Tunggal, Melaka, Malaysia. +4 more
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n-Channel Bulk and DTMOS FinFETs: Investigation of GIDL and Gate Leakage Currents
, 2016 In this work GIDL (Gate Induced Drain Leakage) and Gate Leakage Currents (I-G) have been experimentally investigated for different dimensions of Bulk FinFETs with and without Dynamic Threshold MOS configuration (DTMOS) in linear and saturation regions ...
Martino, Joao Antonio +5 more
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DRAM 셀 트렌지스터의 GIDL RTN에 의한 산화막 트랩의 위치 의존성 분석 [PDF]
, 2014 학위논문 (석사)-- 서울대학교 대학원 : 전기·컴퓨터공학부, 2014. 2. Shin Hyungcheol.As device dimensions are minimized, random telegraph noise (RTN) is dominant in determining the performance and reliability of metal-oxide-semiconductor field effect transistor (MOSFET).
콴뉴엔기아
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Simulation Study on the Role of GIDL Current for Erase Operation in FeFETs
JSAP Annual Meetings Extended Abstracts, 2021 Mei, Xiaoran +3 more
openaire +1 more source
Investigation of Erase Cycling Induced Joint Dummy Cell Disturbance in Dual-Deck 3D NAND Flash Memory. [PDF]
Micromachines (Basel), 2023 You K, Jin L, Jia J, Huo Z.
europepmc +1 more source
, 2018 The excited-state intramolecular proton transfer (ESIPT)-based molecular probes have drawn significant attention owing to their environment-sensitive fluorescence properties, large Stokes shift, and emerged as building blocks for the development of ...
MD. Waseem Hussain +7 more
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The Impact of Gate-Induced Drain Leakage (GIDL) on Scaled MOSFETs for Low Power Device [PDF]
, 2018 In this research, we investigated the impact of Gate-Induced Drain Leakage (GIDL) on scaled Metal-OxideSemiconductor Field-Effect Transistor (MOSFET) for low power application.
Hanim, A.R.; Micro Nano Electronics (MiNE), Centre for Telecommunication Research and Innovation, Faculty of Electronics and Computer Engineering, Universiti Teknikal Malaysia Melaka, Hang Tuah Jaya, 76100 Durian Tunggal, Melaka, Malaysia. +6 more
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(PDF) Erase My Back Pain Review: Emily Lark | Erase My Back Pain Exercises by Emily Lark
, 2019 Emily Lark’s The Erase My Back Pain is an online program designed to help people from eliminate back pain naturally without any pain medications or surgery.
Emily Lark (8188314)
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Effects of Poly-Si Grain Boundary on Retention Characteristics under Cross-Temperature Conditions in 3-D NAND Flash Memory. [PDF]
Micromachines (Basel), 2023 An U +6 more
europepmc +1 more source