Results 41 to 43 of about 70 (43)

Erase-Verify Operation in Ferroelectric 3D Vertical NAND Storage

IEEE Electron Device Letters
Vijaykrishnan Narayanan, Jaydeep Kulkarni, Kai Ni   +2 more
exaly  

Novel p-Type Bulk-Inserted Bitline Pad Structure for Efficient Erase Operation in Vertical NAND Flash Memory

IEEE Transactions on Electron Devices
Jongwook Jeon, Hyoungsub Kim
exaly  

SiGe/Si Heterojunction Drain Transistor for Faster 3D NAND Flash Memory Erase

Tsu-Jae Liu
exaly