Results 31 to 40 of about 70 (43)
Some of the next articles are maybe not open access.
A Process-Aware Compact Model for GIDL-Assisted Erase Optimization of 3-D V-NAND Flash Memory
IEEE Transactions on Electron Devices, 2023Soyoung Kim, Yohan Kim
exaly +2 more sources
A Compact Model for GIDL-Assisted Erase Transients of 3D MONOS Charge-Trap NAND Flash Memories
2025 9th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)Hyungcheol Shin, Sungju Kim
exaly +2 more sources
Investigation of Hot Carrier Injection During GIDL Erase Operation in 3-D NAND Flash Memory
IEEE Transactions on Electron DevicesWoo Young Choi +2 more
exaly +2 more sources
Analysis of GIDL Erase Characteristics in Vertical NAND Flash Memory
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2023Ho-Nam Yoo +4 more
openaire +1 more source
Extended Abstracts of the 2022 International Conference on Solid State Devices and Materials, 2022
Moonkyu Song +2 more
openaire +1 more source
Moonkyu Song +2 more
openaire +1 more source
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Sungju Kim +2 more
openaire +1 more source
Sungju Kim +2 more
openaire +1 more source
First Demonstration of 1-bit Erase in Vertical NAND Flash Memory
2022Byung Park, Ho-Nam Yoo, Jong-Ho Lee
exaly

