Results 21 to 30 of about 12,622 (259)

Simulation Study on Dynamic and Static Characteristics of Novel SiC Gate-Controlled Bipolar-Field-Effect Composite Transistor

open access: yesIEEE Journal of the Electron Devices Society, 2020
In this article, a novel bipolar-field-effect composite power transistor, called SiC GCBT (Silicon Carbide Gate-Controlled Bipolar-field-effect Composite Transistor) is presented and studied.
Yipan Zhang, Baoxing Duan, Yintang Yang
doaj   +1 more source

Heat Dissipation Characteristics of IGBT Module Based on Flow-Solid Coupling

open access: yesMicromachines, 2022
With the increase of power level and integration in electric vehicle controllers, the heat flux of the key silicon-based IGBT (Insulated Gate Bipolar Transistor) device has reached its physical limit.
Lipeng Tan   +5 more
doaj   +1 more source

Low Switching Loss Built-In Diode of High-Voltage RC-IGBT with Shortened P+ Emitter

open access: yesMicromachines, 2023
In this paper, a low switching loss built-in diode of a high-voltage reverse-conducting insulated gate bipolar transistor (RC-IGBT) is proposed without deteriorating IGBT characteristics.
Wei Wu   +5 more
doaj   +1 more source

Failure precursors for insulated gate bipolar transistors (IGBTs) [PDF]

open access: yes9th International Seminar on Power Semiconductors (ISPS 2008), 2008
Failure precursors indicate changes in a measured variable that can be associated with impending failure. By identifying precursors to failure and by monitoring them, system failures can be predicted and actions can be taken to mitigate their effects. In this study, three potential failure precursor candidates, threshold voltage, transconductance, and ...
N. Patil, D. Das, K. Goebel, M. Pecht
openaire   +1 more source

Solidifying Power Electronics [Historical] [PDF]

open access: yes, 2018
More than one century ago, in 1902, American engineer Peter Cooper Hewitt (1861\u20131921) derived the mercury arc-rectifier, enclosed in a glass bulb, from his mercury-vapor lamp of the previous year.
Guarnieri, Massimo
core   +1 more source

Thermo-mechanical stress of bonded wires used in high power modules with alternating and direct current modes [PDF]

open access: yes, 2012
Today, power electronic reliability is a main subject of interest for many companies and laboratories. The main process leading to the IGBT failure is the cycling thermal stress.
Medjahed, Hassen   +2 more
core   +4 more sources

Modelling and simulation of sinusoidal pulse width modulation controller for solar photovoltaic inverter to minimize the switching losses and improving the system efficiency [PDF]

open access: yesArchives of Electrical Engineering, 2022
With the extinction of fossil fuels and high increase in power demand, the necessity for renewable energy power generation has increased globally. Solar PV is one such renewable energy power generation, widely used these days in the power sector.
Sivaraj Panneerselvam   +2 more
doaj   +1 more source

Least Squares Method for Identification of IGBT Thermal Impedance Networks Using Direct Temperature Measurements

open access: yesEnergies, 2020
State-of-the-art methods for determining thermal impedance networks for IGBT (Insulated Gate Bipolar Transistor) modules usually involves the establishment of the relationship between the measured transistor or diode voltage and temperature under ...
Humphrey Mokom Njawah Achiri   +3 more
doaj   +1 more source

Stochastic RUL calculation enhanced with TDNN-based IGBT failure modeling [PDF]

open access: yes, 2016
Power electronics are widely used in the transport and energy sectors. Hence, the reliability of these power electronic components is critical to reducing the maintenance cost of these assets.
Alghassi, Alireza   +2 more
core   +1 more source

Investigation of FACTS devices to improve power quality in distribution networks [PDF]

open access: yes, 2011
Flexible AC transmission system (FACTS) technologies are power electronic solutions that improve power transmission through enhanced power transfer volume and stability, and resolve quality and reliability issues in distribution networks carrying ...
Rehman Shaikh, Muhammad Asim   +1 more
core   +1 more source

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