Results 1 to 10 of about 168 (150)

Inverse Lithography Technology (ILT) Under Chip Manufacture Context

open access: yesMicromachines
As semiconductor process nodes shrink to 3 nm and beyond, traditional optical proximity correction (OPC) and resolution enhancement technologies (RETs) can no longer meet the high patterning precision needs of advanced chip manufacturing due to the sub ...
Xiaodong Meng, Cai Chen, Jie Ni
doaj   +6 more sources

Advancements and challenges in inverse lithography technology: a review of artificial intelligence-based approaches

open access: yesLight: Science & Applications
Inverse lithography technology (ILT) is a promising approach in computational lithography to address the challenges posed by shrinking semiconductor device dimensions.
Yixin Yang   +4 more
doaj   +3 more sources

Inverse Lithography Source Optimization via Particle Swarm Optimization and Genetic Combined Algorithm

open access: yesIEEE Photonics Journal, 2023
Inverse lithography technologies (ILTs) are critical for improving the imaging performance of lithography in advanced technology nodes. Pixel-based source optimization (SO), as an efficient part of ILTs, can be implemented via heuristic approaches to ...
Haifeng Sun   +7 more
doaj   +1 more source

Label-free neural networks-based inverse lithography technology

open access: yesOptics Express, 2022
Neural network-based inverse lithography technology (NNILT) has been used to improve the computational efficiency of large-scale mask optimization for advanced photolithography. NNILT is now mostly based on labels, and its performance is affected by the quality of labels.
Jing-Tao Chen   +4 more
openaire   +2 more sources

Fast and Accurate Machine Learning Inverse Lithography Using Physics Based Feature Maps and Specially Designed DCNN

open access: yesJournal of Microelectronic Manufacturing, 2020
Inverse lithography technology (ILT) is intended to achieve optimal mask design to print a lithography target for a given lithography process. Full chip implementation of rigorous inverse lithography remains a challenging task because of enormous ...
Xuelong Shi   +6 more
doaj   +1 more source

A Study of 2D Assist Feature Placement

open access: yesJournal of Microelectronic Manufacturing, 2020
Sub-resolution assist features have been widely recognized in lithography patterning. In general, the insertion of assist features in optically adjacent space around main designed features, will change the aerial image intensity profiles of corresponding
Liang Zhu   +3 more
doaj   +1 more source

Study of Inverse Lithography Approaches based on Deep Learning

open access: yesJournal of Microelectronic Manufacturing, 2020
Computational lithography (CL) has become an indispensable technology to improve imaging resolution and fidelity of deep sub-wavelength lithography. The state-of-the-art CL approaches are capable of optimizing pixel-based mask patterns to effectively ...
Xianqiang Zheng   +4 more
doaj   +1 more source

High-performance grating couplers on 220-nm thick silicon by inverse design for perfectly vertical coupling

open access: yesScientific Reports, 2023
Efficient grating couplers (GCs) for perfectly vertical coupling are difficult to realize due to the second-order back reflection. In this study, apodized GCs (AGCs) are presented for achieving perfectly-vertical coupling to 220 nm thick silicon-on ...
Mingxiang Yang   +6 more
doaj   +1 more source

Single spherical mirror optic for extreme ultraviolet lithography enabled by inverse lithography technology

open access: yesOptics Express, 2014
Traditionally, aberration correction in extreme ultraviolet (EUV) projection optics requires the use of multiple lossy mirrors, which results in prohibitively high source power requirements. We analyze a single spherical mirror projection optical system where aberration correction is built into the mask itself, through Inverse Lithography Technology ...
Gregg, Scranton   +3 more
openaire   +2 more sources

Multi-Objective Defocus Robust Source and Mask Optimization Using Sensitive Penalty

open access: yesApplied Sciences, 2019
The continuous decrease in the size of lithographic technology nodes has led to the development of source and mask optimization (SMO) and also to the control of defocus becoming stringent in the actual lithography process.
Pengzhi Wei   +5 more
doaj   +1 more source

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