Peak Force Infrared–Kelvin Probe Force Microscopy
Angewandte Chemie, 2020 AbstractCorrelative scanning probe microscopy of chemical identity, surface potential, and mechanical properties provide insight into the structure–function relationships of nanomaterials. However, simultaneous measurement with comparable and high resolution is a challenge.
Devon S. Jakob +5 more
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High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method [PDF]
Data in Brief, 2020 This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface.
Young Min Park +3 more
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SCANNING KELVIN PROBE APPLIED TO LOCALISED CORROSION
Journal of Fundamental and Applied Sciences, 2015 This paper focuses on specific applications of the SKP system. The instrument is calibrated, using different thickness of a model polymer Poly Vinyl Butyral (PVB) on mild steel and on galvanised steel.
S. K. M. Haque, A. Hussain
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Artifacts in time-resolved Kelvin probe force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2018 Kelvin probe force microscopy (KPFM) has been used for the characterization of metals, insulators, and semiconducting materials on the nanometer scale. Especially in semiconductors, the charge dynamics are of high interest.
Sascha Sadewasser +2 more
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Kelvin probe force microscopy of nanocrystalline TiO2 photoelectrodes [PDF]
Beilstein Journal of Nanotechnology, 2013 Dye-sensitized solar cells (DSCs) provide a promising third-generation photovoltaic concept based on the spectral sensitization of a wide-bandgap metal oxide.
Alex Henning +8 more
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Application of Scanning Kelvin Probe in the Study of Protective Paints
Frontiers in Materials, 2019 Industrial coatings are composed of layers of different polymers (top coats, primers) containing pigments, corrosion inhibitors, and fillers as well as additives.
Andrej Nazarov, Dominique Thierry
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Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy. [PDF]
Nanoscale Res Lett, 2018 Graphene oxide (GO) films were formed by drop-casting method and were studied by FTIR spectroscopy, micro-Raman spectroscopy (mRS), X-ray photoelectron spectroscopy (XPS), four-points probe method, atomic force microscopy (AFM), and scanning Kelvin probe
Slobodian OM +7 more
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Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy. [PDF]
ACS Nano, 2018 There are currently no experimental techniques that combine atomic-resolution imaging with elemental sensitivity and chemical fingerprinting on single molecules.
Schulz F +5 more
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Scanning Kelvin Probe Microscopy: Challenges and Perspectives towards Increased Application on Biomaterials and Biological Samples. [PDF]
Materials (Basel), 2018 We report and comment on the possible increase of application of scanning Kelvin probe microscopy (SKPM) for biomaterials, biological substrates, and biological samples. First, the fundamental concepts and the practical limitations of SKPM are presented,
Salerno M, Dante S.
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Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices. [PDF]
Beilstein J Nanotechnol, 2018 In this study we investigate the influence of the operation method in Kelvin probe force microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film ...
Axt A +4 more
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