Dual-heterodyne Kelvin probe force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2023 We present a new open-loop implementation of Kelvin probe force microscopy (KPFM) that provides access to the Fourier spectrum of the time-periodic surface electrostatic potential generated under optical (or electrical) pumping with an atomic force ...
Benjamin Grévin +3 more
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Artifacts in time-resolved Kelvin probe force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2018 Kelvin probe force microscopy (KPFM) has been used for the characterization of metals, insulators, and semiconducting materials on the nanometer scale. Especially in semiconductors, the charge dynamics are of high interest.
Sascha Sadewasser +2 more
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Kelvin probe force microscopy in liquid using electrochemical force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2015 Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid–gas interface.
Liam Collins +6 more
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Visualization of π-hole in molecules by means of Kelvin probe force microscopy [PDF]
Nature Communications, 2023 Submolecular charge distribution significantly affects the physical-chemical properties of molecules and their mutual interaction. One example is the presence of a π-electron-deficient cavity in halogen-substituted polyaromatic hydrocarbon compounds, the
B. Mallada +7 more
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High resolution atomic force and Kelvin probe force microscopy image data of InAs(001) surface using frequency modulation method [PDF]
Data in Brief, 2020 This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface.
Young Min Park +3 more
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Kelvin probe force microscopy of nanocrystalline TiO2 photoelectrodes [PDF]
Beilstein Journal of Nanotechnology, 2013 Dye-sensitized solar cells (DSCs) provide a promising third-generation photovoltaic concept based on the spectral sensitization of a wide-bandgap metal oxide.
Alex Henning +8 more
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Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2022 Surface photovoltage (SPV) measurements are a crucial way of investigating optoelectronic and photocatalytic semiconductors. The local SPV is generally measured consecutively by Kelvin probe force microscopy (KPFM) in darkness and under illumination, in ...
Masato Miyazaki +2 more
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Pulsed Force Kelvin Probe Force Microscopy-A New Type of Kelvin Probe Force Microscopy under Ambient Conditions. [PDF]
J Phys Chem C Nanomater InterfacesKelvin probe force microscopy (KPFM) is an increasingly popular scanning probe microscopy technique used for nanoscale imaging of surface potential for various materials, such as metals, semiconductors, biological samples, and photovoltaics, to reveal their surface work function and/or local accumulation of charges.
Zahmatkeshsaredorahi A, Jakob DS, Xu XG.
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Thin NaCl films on silver (001): island growth and work function
New Journal of Physics, 2012 The surface work function (WF) and substrate temperature dependence of the NaCl thin-film growth on Ag(001) have been studied by noncontact atomic force microscopy and Kelvin probe force microscopy.
Gregory Cabailh +2 more
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Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode [PDF]
Beilstein Journal of Nanotechnology, 2021 The open-loop (OL) variant of Kelvin probe force microscopy (KPFM) provides access to the voltage response of the electrostatic interaction between a conductive atomic force microscopy (AFM) probe and the investigated sample. The measured response can be
Gheorghe Stan, Pradeep Namboodiri
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