Exploring the Electrical Properties of Twisted Bilayer Graphene [PDF]
, 2019 Two-dimensional materials exhibit properties unlike anything else seen in conventional substances. Electrons in these materials are confined to move only in the plane.
Greenlee, Byron D. +4 more
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Blue emitting organic semiconductors under high pressure:status and outlook [PDF]
, 2016 The microstructure of ZK40, ZK40 with 2 wt% of Nd and Gd (ZK40-2Nd and ZK40-2Gd, respectively) were investigated with optical, scanning and transmission electron microscopy, X-ray diffraction and Scanning Kelvin Probe Force Microscopy.
Guha, Suchismita, Knaapila, Matti
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Near-equilibrium measurement of quantum size effects using Kelvin probe force microscopy
, 2017 In nano-structures such as thin films electron confinement results in the quantization of energy levels in the direction perpendicular to the film. The discretization of the energy levels leads to the oscillatory dependence of many properties on the film
Hoffmann-Vogel, Regina +4 more
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Possible Luttinger liquid behavior of edge transport in monolayer transition metal dichalcogenide crystals. [PDF]
, 2020 In atomically-thin two-dimensional (2D) semiconductors, the nonuniformity in current flow due to its edge states may alter and even dictate the charge transport properties of the entire device.
Cao, Jingchen +32 more
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Mechanism of Polarization Fatigue in BiFeO3: the Role of Schottky Barrier
, 2013 By using piezoelectric force microscopy and scanning Kelvin probe microscopy, we have investigated the domain evolution and space charge distribution in planar BiFeO3 capacitors with different electrodes.
Chen, Lang +7 more
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Demonstration of an electrostatic-shielded cantilever
, 2005 The fabrication and performances of cantilevered probes with reduced parasitic capacitance starting from a commercial Si3N4 cantilever chip is presented.
Alessandrini, A. +6 more
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Intermodulation electrostatic force microscopy for imaging surface photo-voltage
, 2014 We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic force microscopy tip while driving the cantilever near its resonance ...
Daniel Forchheimer +6 more
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In situ topographical chemical and electrical imaging of carboxyl graphene oxide at the nanoscale
Nature Communications, 2018 Mapping the distribution of functional groups on 2D materials with high resolution remains challenging. Here, the authors combine tip-enhanced Raman spectroscopy and Kelvin probe force microscopy to simultaneously examine the topography, chemical ...
Weitao Su +3 more
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Synthesis, characterization and electrostatic properties of WS2 nanostructures
AIP Advances, 2014 We report the direct growth of atomically thin WS2 nanoplates and nanofilms on the SiO2/Si (300 nm) substrate by vapor phase deposition method without any catalyst.
Yinping Fan +6 more
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A Multi-scale Approach for Simulations of Kelvin Probe Force Microscopy with Atomic Resolution
, 2012 The distance dependence and atomic-scale contrast observed in nominal contact potential difference (CPD) signals recorded by KPFM on surfaces of insulating and semiconducting samples, have stimulated theoretical attempts to explain such effects.
Alexis Baratoff +11 more
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