Kelvin probe force microscopy kpfm

Organic and Hybrid Field-Effect Transistors XIX, 2020
Using Kelvin Probe Force Microscopy (KPFM), we performed surface-potential measurements on operating organic thin-film transistors (TFTs). Several parameters inaccessible through current-voltage measurements were determined, namely the source and drain resistances separately, the threshold voltage and the electric field along the channel.
Mélanie Brouillard +5 more
openaire +1 more source

Label-free detection of the aptamer binding on protein patterns using Kelvin probe force microscopy (KPFM)

Analytical and Bioanalytical Chemistry, 2009
Anti-lysozyme aptamers are found to preferentially bind to the edge of a tightly packed lysozyme pattern. Such edge-binding is due to the better accessibility and flexibility of the edge lysozyme molecules. Kelvin probe force microscopy (KPFM) was used to study the aptamer-lysozyme binding. Our results show that KPFM is capable of detecting the aptamer-
Pei, Gao, Yuguang, Cai
openaire +2 more sources

Study of heterostructures of Cu₃BiS₃–buffer layer measured by Kelvin probe force microscopy measurements (KPFM)

Canadian Journal of Physics, 2014
The interface formed between Cu3BiS3 thin films and the buffer layer is a potentially limiting factor to the performance of solar cells based on Al/Cu3BiS3/buffer heterojunctions. The buffer layers of ZnS and In2S3 were grown by co-evaporation, and tested as an alternative to the traditional CdS deposited by chemical bath deposition.
F. Mesa, D. Fajardo
openaire +1 more source

Unraveling Spatiotemporal Transient Dynamics at the Nanoscale via Wavelet Transform-Based Kelvin Probe Force Microscopy

ACS Nano, 2023
Navneet Soin, Amir Farokh Payam
exaly

kelvin probe force microscopy
kpfm
surface photovoltage

physics
thin film
atomic force microscopy

surface potential