Results 231 to 240 of about 3,099 (255)

Impact of Structural Heterogeneities in Hierarchically Grown Microribbons on 2D WS₂ Monolayer on the Measured Local Hydrogen Evolution Activity on Au Substrate. [PDF]

Small
Adofo LA, Pérez Mendoza AE, Joo M, Madayan-Banatheth L, Ben-Smith A, Kim KK, Scheu C, Andronescu C.   +7 more
europepmc   +1 more source

Thickness dependent oxidation in CrCl₃: a scanning X-ray photoemission and Kelvin probe microscopies study. [PDF]

Beilstein J Nanotechnol
Kazim S, Parmar R, Azizinia M, Amati M, Rauf M, Di Cicco A, Rezvani SJ, Mastrippolito D, Ottaviano L, Klimczuk T, Gregoratti L, Gunnella R.   +11 more
europepmc   +1 more source

Pulsed Force Kelvin Probe Force Microscopy

ACS Nano, 2020
Measurement of the contact potential difference (CPD) and work functions of materials are important in analyzing their electronic structures and surface residual charges.
Devon S Jakob, Haomin Wang, Xiaoji G Xu
exaly   +2 more sources

Contrast Formation in Kelvin Probe Force Microscopy of Single π-Conjugated Molecules

Nano Letters, 2014
We report the contrast formation in the local contact potential difference (LCPD) measured by Kelvin probe force microscopy (KPFM) on single charge-transfer complexes (CTCs) on a NaCl bilayer on Cu(111).
Bruno Schüler, Shi-Xia Liu, Yan Geng
exaly   +2 more sources

Some of the next articles are maybe not open access.

Related searches:

Investigation on organic thin film transistors (TFT) by Kelvin probe force microscopy (KPFM)

Organic and Hybrid Field-Effect Transistors XIX, 2020
Using Kelvin Probe Force Microscopy (KPFM), we performed surface-potential measurements on operating organic thin-film transistors (TFTs). Several parameters inaccessible through current-voltage measurements were determined, namely the source and drain resistances separately, the threshold voltage and the electric field along the channel.
Mélanie Brouillard, Ute Zschieschang, Nicolas Bogdan Bercu, Olivier Simonetti, Hagen Klauk, Louis Giraudet   +5 more
openaire   +1 more source

Label-free detection of the aptamer binding on protein patterns using Kelvin probe force microscopy (KPFM)

Analytical and Bioanalytical Chemistry, 2009
Anti-lysozyme aptamers are found to preferentially bind to the edge of a tightly packed lysozyme pattern. Such edge-binding is due to the better accessibility and flexibility of the edge lysozyme molecules. Kelvin probe force microscopy (KPFM) was used to study the aptamer-lysozyme binding. Our results show that KPFM is capable of detecting the aptamer-
Pei, Gao, Yuguang, Cai
openaire   +2 more sources

Study of heterostructures of Cu₃BiS₃–buffer layer measured by Kelvin probe force microscopy measurements (KPFM)

Canadian Journal of Physics, 2014
The interface formed between Cu3BiS3 thin films and the buffer layer is a potentially limiting factor to the performance of solar cells based on Al/Cu3BiS3/buffer heterojunctions. The buffer layers of ZnS and In2S3 were grown by co-evaporation, and tested as an alternative to the traditional CdS deposited by chemical bath deposition.
F. Mesa, D. Fajardo
openaire   +1 more source

Quantitative comparison of closed-loop and dual harmonic Kelvin probe force microscopy techniques

Review of Scientific Instruments, 2018
Kelvin probe force microscopy (KPFM) is a widely used technique to map surface potentials at the nanometer scale. In traditional KPFM, a feedback loop regulates the DC bias applied between a sharp conductive probe and a sample to nullify the ...
Jason I Kilpatrick, Liam Collins, Stefan A L Weber   +2 more
exaly   +3 more sources

Imaging the Carrier Photogeneration in Nanoscale Phase Segregated Organic Heterojunctions by Kelvin Probe Force Microscopy

Nano Letters, 2010
International audienceIn this work, we spatially resolve by Kelvin probe force microscopy (KPFM) under ultrahigh vacuum (UHV) the surface photovoltage in high-efficiency nanoscale phase segregated photovoltaic blends of poly(3-hexylthiophene) and [6,6 ...
Evan J Spadafora, Renaud Demadrille, Bernard Ratier   +2 more
exaly   +2 more sources

Cross-talk artefacts in Kelvin probe force microscopy imaging: A comprehensive study

Journal of Applied Physics, 2014
We provide in this article a comprehensive study of the role of ac cross-talk effects in Kelvin Probe Force Microscopy (KPFM), and their consequences onto KPFM imaging.
H Diesinger, T Melin
exaly   +2 more sources