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Dual harmonic Kelvin probe force microscopy at the graphene–liquid interface
Applied Physics Letters, 2014 Kelvin probe force microscopy (KPFM) is a powerful technique for the determination of the contact potential difference (CPD) between an atomic force microscope tip and a sample under ambient and vacuum conditions.
Liam Collins +2 more
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Kelvin Probe Force Microscopy (KPFM) for nanoelectronic device characterisation [PDF]
, 2016 This project is to develope a new method of characterization for Silicon-nano-wire (SiNW) FET and SET devices by using KPFM technology to derive the information of local surface potential change on the channel of SiNW devices. The surface potential is related to many important parameters on material's surface, e.g.
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Pulsed Force Kelvin Probe Force Microscopy through Integration of Lock-In Detection
Nano Letters, 2023Amirhossein Zahmatkeshsaredorahi +2 more
exaly
Torsional Harmonic Kelvin Probe Force Microscopy for High-Sensitivity Mapping of Surface Potential
IEEE Transactions on Industrial Electronics, 2022Hao Zhang, Haibo Gao, Junyuan Geng
exaly
Kelvin probe force microscopy and its application
Surface Science Reports, 2011Andrew C Kümmel, Sangyeob Lee
exaly
Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy
Advanced Materials, 2006Vincenzo Palermo +2 more
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Surface potential studies of self-assembling monolayers using Kelvin probe force microscopy
Surface and Interface Analysis, 1999Ernst Meyer +2 more
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