Results 251 to 255 of about 3,099 (255)

Practical aspects of single-pass scan Kelvin probe force microscopy

Review of Scientific Instruments, 2012
Guangyong Li, Fei Lan, Liming Liu
exaly  

Dissipation Modulated Kelvin Probe Force Microscopy Method

Springer Series in Surface Sciences, 2018
Yoichi Miyahara, Peter Grutter, Miyahara Yoichi   +2 more
exaly  

The interlayer screening effect of graphene sheets investigated by Kelvin probe force microscopy

Applied Physics Letters, 2009
J W Yoo, C J Kang, D C Kim
exaly  

Investigation of atomic surface potential on Si(111)-7×7 surface by high-frequency heterodyne-Kelvin probe force microscopy

Surfaces and Interfaces
Yan Jun Li, Jiuyan Wei, Yasuhiro Sugawara   +2 more
exaly  

Study of physical properties of antiphase boundaries in III-V epitaxial layer on silicon with conductive tip atomic force microscopy (C-AFM) and with Kelvin Probe Force Microscopy (KPFM) techniques.

Bernard, Rozenn, Ramonda, Michel, Gilbert, Audrey, Rohel, Tony, Le Pouliquen, Julie, Tavernier, Karine, Bertru, Nicolas, Rodriguez, Jean-Baptiste, Tournié, Eric, Léger, Yoan, Cornet, Charles   +10 more
openaire   +1 more source