Results 11 to 20 of about 5,628 (300)
Hidden surface photovoltages revealed by pump probe KPFM [PDF]
Nanotechnology, 2022 Abstract In this work, we use pump-probe Kelvin probe force microscopy (pp-KPFM) in combination with non-contact atomic force microscopy (nc-AFM) under ultrahigh vacuum, to investigate the nature of the light-induced surface potential dynamics in alumina-passivated crystalline silicon, and in an organic bulk ...
Valentin Aubriet +5 more
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Study of high–low KPFM on a pn-patterned Si surface [PDF]
Microscopy, 2022 Abstract Comparative measurements between frequency modulation Kelvin probe force microscopy (FM-KPFM) using low frequency bias voltage and heterodyne FM-KPFM using high frequency bias voltage were performed on the surface potential measurement. A silicon substrate patterned with p- and n-type impurities was used as a quantitative sample.
Ryo Izumi +3 more
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Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review
Reports on Progress in Physics, 2018 Fundamental mechanisms of energy storage, corrosion, sensing, and multiple biological functionalities are directly coupled to electrical processes and ionic dynamics at solid-liquid interfaces. In many cases, these processes are spatially inhomogeneous taking place at grain boundaries, step edges, point defects, ion channels, etc and possess complex ...
Liam Collins +3 more
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KPFM - Raman Spectroscopy Coupled Technique for the Characterization of Wide Bandgap Semiconductor Devices [PDF]
Materials Science Forum, 2022 A non-destructive technique for the characterization of the doped regions inside wide bandgap (WBG) semiconductor structures of power devices is presented. It consists in local measurements of the surface potential by Kelvin Probe Force Microscopy (KPFM) coupled to micro-Raman spectroscopy.
Nicolas Bercu +5 more
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Quantitative 3D-KPFM imaging with simultaneous electrostatic force and force gradient detection [PDF]
Nanotechnology, 2015 Kelvin probe force microscopy (KPFM) is a powerful characterization technique for imaging local electrochemical and electrostatic potential distributions and has been applied across a broad range of materials and devices. Proper interpretation of the local KPFM data can be complicated, however, by convolution of the true surface potential under the tip
Liam Collins +7 more
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Workfunction fluctuations in polycrystalline TiN observed with KPFM and their impact on MOSFETs variability [PDF]
Applied Physics Letters, 2019 A more realistic approach to evaluate the impact of polycrystalline metal gates on the MOSFET variability is presented. 2D experimental workfunction maps of a polycrystalline TiN layer were obtained by Kelvin Probe Force Microscopy with a nanometer resolution.
A. Ruiz +7 more
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Dual-heterodyne Kelvin probe force microscopy
Beilstein Journal of Nanotechnology, 2023 We present a new open-loop implementation of Kelvin probe force microscopy (KPFM) that provides access to the Fourier spectrum of the time-periodic surface electrostatic potential generated under optical (or electrical) pumping with an atomic force ...
Benjamin Grévin +3 more
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Reconstruction of a 2D layer of KBr on Ir(111) and electromechanical alteration by graphene
Beilstein Journal of Nanotechnology, 2021 A novel reconstruction of a two-dimensional layer of KBr on an Ir(111) surface is observed by high-resolution noncontact atomic force microscopy and verified by density functional theory (DFT).
Zhao Liu +6 more
doaj +1 more source