KPFM surface photovoltage measurement and numerical simulation [PDF]
EPJ Photovoltaics, 2019 A method for the analysis of Kelvin probe force microscopy (KPFM) characterization of semiconductor devices is presented. It enables evaluation of the influence of defective surface layers.
Marchat Clément +5 more
doaj +4 more sources
Hidden surface photovoltages revealed by pump probe KPFM [PDF]
Nanotechnology, 2022 Abstract In this work, we use pump-probe Kelvin probe force microscopy (pp-KPFM) in combination with non-contact atomic force microscopy (nc-AFM) under ultrahigh vacuum, to investigate the nature of the light-induced surface potential dynamics in alumina-passivated crystalline silicon, and in an organic bulk ...
Aubriet, Valentin +5 more
openaire +5 more sources
KPFM - Raman Spectroscopy Coupled Technique for the Characterization of Wide Bandgap Semiconductor Devices [PDF]
Materials Science Forum, 2022 A non-destructive technique for the characterization of the doped regions inside wide bandgap (WBG) semiconductor structures of power devices is presented. It consists in local measurements of the surface potential by Kelvin Probe Force Microscopy (KPFM) coupled to micro-Raman spectroscopy.
Bercu, Nicolas +5 more
openaire +5 more sources
Controlled manipulation of oxygen vacancies using nanoscale flexoelectricity [PDF]
, 2017 Oxygen vacancies, especially their distribution, are directly coupled to the electromagnetic properties of oxides and related emergent functionalities that have implication in device applications.
Cao, Ye +10 more
core +3 more sources
Data in Brief, 2020 This article provides data on the scanning tunnelling microscopy (STM), atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) images of InAs(001) surface.
Young Min Park +3 more
doaj +1 more source
Beilstein Journal of Nanotechnology, 2023 In this work, a silicon photodiode integrated with a piezoelectric membrane is studied by Kelvin probe force microscopy (KPFM) under modulated illumination.
Zeinab Eftekhari +8 more
doaj +1 more source
Interface Dipole : Effects on Threshold Voltage and Mobility for both Amorphous and Poly-crystalline Organic Field Effect Transistors [PDF]
, 2014 We report a detailed comparison on the role of a self-assembled monolayer (SAM) of dipolar molecules on the threshold voltage and charge carrier mobility of organic field-effect transistor (OFET) made of both amorphous and polycrystalline organic ...
Celle, C. +8 more
core +3 more sources
Photo-response of Two-Dimensional Ruddlesden-Popper Perovskite Films for Photovoltaics [PDF]
E3S Web of Conferences, 2021 Two-dimensional (2D) Ruddlesden-Popper (RP) perovskites have emerged as a prospective candidate to address the instability issues of traditional perovskite solar cells.
Wu Gao, Cai Molang, Dai Songyuan
doaj +1 more source
Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices
Beilstein Journal of Nanotechnology, 2018 In this study we investigate the influence of the operation method in Kelvin probe force microscopy (KPFM) on the measured potential distribution. KPFM is widely used to map the nanoscale potential distribution in operating devices, e.g., in thin film ...
Amelie Axt +4 more
doaj +1 more source
Compensating for artifacts in scanning near-field optical microscopy due to electrostatics
APL Photonics, 2021 Nanotechnology and modern materials science demand reliable local probing techniques on the nanoscopic length scale. Most commonly, scanning probe microscopy methods are applied in numerous variants and shades, for probing the different sample properties.
Tobias Nörenberg +4 more
doaj +1 more source