Results 41 to 50 of about 117,202 (206)

DMD-based adaptive lithography system for real-time substrate deformation compensation

open access: yesInternational Journal of Optomechatronics
This article presents a novel DMD-based adaptive lithography system enabling real-time compensation for substrate deformation during patterning. The system integrates conventional DMD lithography with optical measurement capabilities to quantify ...
Jinsu Choi   +5 more
doaj   +1 more source

Rolling Nanoelectrode Lithography [PDF]

open access: yesMicromachines, 2020
Non-uniformity and low throughput issues severely limit the application of nanoelectrode lithography for large area nanopatterning. This paper proposes, for the first time, a new rolling nanoelectrode lithography approach to overcome these challenges. A test-bed was developed to realize uniform pressure distribution over the whole contact area between ...
Hasan, Rashed Md. Murad   +2 more
openaire   +6 more sources

Extended Abbe approach for fast and accurate lithography imaging simulations

open access: yes, 2022
Paper 747007This paper presents an extended Abbe based imaging algorithm for faster and more accurate simulations of current and future projection lithography systems.
Evanschitzky, P.   +2 more
core   +1 more source

Mechanically Tunable Mechanochromic Device with Covert‐Overt Structural Color and Modulation of its Transparency

open access: yesAdvanced Materials Interfaces
In this study, A novel mechanically responsive optical device (MROD) is introduced which is capable of modulating light transmission and produces iridescent structural colors under reflection.
Nguyen Hoang Minh   +4 more
doaj   +1 more source

COPYRIGHT PROTECTED PLASTIC ARTWORK IN THE LIGHT OF THE EUROPEAN AND ROMANIAN LAWS AND THE ARTWORK VALUE RELEVANCE [PDF]

open access: yesChallenges of the Knowledge Society, 2018
The plastic artwork, as a species of the "work of art" genre, is subjected to copyright. However, the law does not define plastic artworks, which are generally included in non-exhaustive listings, in phrases of the types: "plastic or graphical artworks,
Mihai OLARIU
doaj  

Polymer Pen Lithography [PDF]

open access: yesScience, 2008
We report a low-cost, high-throughput scanning probe lithography method that uses a soft elastomeric tip array, rather than tips mounted on individual cantilevers, to deliver inks to a surface in a “direct write” manner. Polymer pen lithography merges the feature size control of dip-pen nanolithography with the large-area capability of contact printing.
Giam, Louise R.   +5 more
openaire   +4 more sources

Accurate determination of 3D PSF and resist effects in grayscale laser lithography

open access: yes, 2022
Paper 107750I, 7 S.Accurate calibration of the optical and resist parameters is invaluable for the computation of the dose distribution needed to fabricate a desired non-binary photoresist topography. This paper presents a method for precisely evaluating
Erdmann, A.   +3 more
core   +1 more source

Synthesis and characterization of TeO2-B2O3-CaO-ZnO glass systems for improved radiation shielding performance

open access: yesJournal of Radiation Research and Applied Sciences
This study aims to develop glass materials with enhanced radiation shielding properties with better attenuation performance by combining B2O3-TeO2-ZnO-CaO glasses with a fixed TeO2 content and varying concentrations of B2O3, ZnO, and CaO.
Reem Darwesh   +3 more
doaj   +1 more source

Hotspot Detection of Semiconductor Lithography Circuits Based on Convolutional Neural Network

open access: yesJournal of Microelectronic Manufacturing, 2018
In the advanced semiconductor lithography manufacturing process, the sub-wavelength lithography gap may cause lithographic error and the difference between the wafer pattern and mask pattern which may cause wafer defects in the later process.
Xingyu Zhou, Youling Yu
doaj   +1 more source

Distortion Detection of Lithographic Projection Lenses Based on Wavefront Measurement

open access: yesPhotonics, 2023
As with the decreasing feature size prompted by Moore’s law and the continuous technological advancements in the semiconductor industry, the distortion of the projection lens is an important factor that affects the overlay.
Tian Li   +8 more
doaj   +1 more source

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