MOCVD-Grown MoS<sub>2</sub> Wafers as a Transfer-Free Platform for Top-Gate Devices via Dry Interface Engineering. [PDF]
Li S +12 more
europepmc +1 more source
Growth of Cubic GaN by MOCVD at High Temperature
High quality cubic GaN (c-GaN) is grown by metalorganic vapor deposition (MOCVD) at an increased growth temperature of 900 ℃, with the growth rate of 1.6 μm/h.
Duan Lihong +7 more
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Pulsed-Liquid-Injection MOCVD of Epitaxial β‑Ga<sub>2</sub>O<sub>3</sub> Thin Films as a Promising Alternative Chemical Route. [PDF]
Velasco Enriquez M +10 more
europepmc +1 more source
ECR plasma in growth of cubic GaN by low pressure MOCVD
To heteroepitaxally grow the crystalline cubic-GaN (c-GaN) film on the substrates with large lattice mismatch is basically important for fabricating the blue or ultraviolet laser diodes based on cubic group III nitride materials.
Gu B +6 more
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Single-Crystalline High-Quality β‑Ga<sub>2</sub>O<sub>3</sub> Pseudosubstrate on Sapphire through Sputtering for Epitaxial Deposition. [PDF]
Wang G +13 more
europepmc +1 more source
Oxygen-Assisted MOCVD Growth of Monolayer PtSe<sub>2</sub> Films With Bandgap Opening for Semiconducting FET Channels. [PDF]
Kim Y +22 more
europepmc +1 more source
Recrystallization-Driven Formation of Single-Crystalline MoS<sub>2</sub> by Metal-Organic Chemical Vapor Epitaxy. [PDF]
Kandybka I +13 more
europepmc +1 more source
Effect of beta-irradiation on photoluminescence of MOCVD grown GaN
The effect of beta particles interaction on the optical properties of MOCVD grown GaN is reported. A significant change in luminescence properties of GaN is observed after exposing the material with 0.6 MeV beta particles with low dose of 10(12) cm(-2 ...
Ali A +4 more
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Heteroepitaxial Growth of GaAs on Ge(111) and Ge(100) by MOCVD. [PDF]
Smith TR +5 more
europepmc +1 more source
MOCVD growth of InN using a GaN buffer
We have investigated MOCVD growth of InN oil sapphire with and without a GaN buffer between 490 and 520 degrees C. The buffer significantly improves the surface morphological uniformity and electrical properties of InN epilayers.
Yang H +8 more
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