Results 11 to 20 of about 3,660 (162)

Direct Evaluation of Self-Heating Effects in Bulk and Ultra-Thin BOX SOI MOSFETs Using Four-Terminal Gate Resistance Technique

open access: yesIEEE Journal of the Electron Devices Society, 2016
We demonstrate clear self-heating effects (SHEs) of bulk and silicon-on-insulator (SOI) MOSFETs for various SOI/buried oxide (BOX) thicknesses including ultra-thin 6 nm BOX, which was not detected by the ac conductance method, using the four-terminal ...
Tsunaki Takahashi   +4 more
doaj   +1 more source

Switching Investigation of SiC MOSFET Based 4-Quadrant Switch

open access: yesIEEE Access, 2023
SiC MOSFETs are suited for several power electronic converters as they reduce loss, increase efficiency, withstand high temperatures and switch faster. SiC MOSFETs are 2-quadrant switches as they can block voltage of only one polarity.
Nishant Anurag, Shabari Nath
doaj   +1 more source

A comparative study of hole and electron inversion layer quantization in MOS structures [PDF]

open access: yesSerbian Journal of Electrical Engineering, 2010
In this paper, an analytical model has been developed to study inversion layer quantization in nanoscale Metal Oxide Semiconductor Field Effect Oxide p-(MOSFET). n-MOSFETs have been studied using the variation approach and the p-MOSFETs have been studied
Chaudhry Amit, Roy Nath Jatinder
doaj   +1 more source

Design and Implementation of a Paralleled Discrete SiC MOSFET Half-Bridge Circuit with an Improved Symmetric Layout and Unique Laminated Busbar

open access: yesEnergies, 2023
Silicon carbide (SiC) metal oxide semiconductor field effect transistors (MOSFETs) have many advantages compared to silicon (Si) MOSFETs: low drain-source resistance, high thermal conductivity, low leakage current, and high switching frequency.
Ismail Ataseven   +2 more
doaj   +1 more source

Challenges and Prospects of Nanoscale MOSFET Scaling: A Review

open access: yesAnbar Journal of Engineering Sciences
This review surveys scaling limitations and solution strategies for nanoscale MOSFETs, including high-k dielectrics, metal gates, FinFETs, GAA devices, and beyond-CMOS technologies.
Ahmed S. Al-Jawadi   +2 more
doaj   +1 more source

Investigation into the Effect of Varied Functional Biointerfaces on Silicon Nanowire MOSFETs

open access: yesSensors, 2012
A biocompatible and functional interface can improve the sensitivity of bioelectronics. Here, 3-aminopropyl trimethoxysilane (APTMS) and 3-mercaptopropyl trimethoxysilane (MPTMS) self-assembled monolayers (SAMs) were independently modified on the surface
Shu-Ping Lin   +3 more
doaj   +1 more source

Influence and reinforcement of gate bias on total dose effect of SiC MOSFET

open access: yes机车电传动, 2023
To address the MOSFETs threshold drift caused by the total dose effect, 1 200 V SiC MOSFETs were used for irradiation experiments. The effect and mechanism of gate bias voltage and high-temperature gate bias annealing after irradiation on the threshold ...
QIU Leshan   +4 more
doaj  

Effect of Source/Drain Lateral Straggle on Distortion and Intrinsic Performance of Asymmetric Underlap DG-MOSFETs

open access: yesIEEE Journal of the Electron Devices Society, 2014
This paper presents a systematic study of the effect of source/drain (S/D) implant lateral straggle on the RF performance of the symmetric and asymmetric underlap double gate (UDG) MOSFET devices.
Kalyan Koley   +3 more
doaj   +1 more source

A Negative-Feedback Gate-Loop for Current Balancing Paralleled SiC MOSFETs Based on a Differential Mode Inductor

open access: yesIEEE Access
Using paralleled SiC MOSFETs is an economical and commonly-used solution for high-power applications. However, the dynamic unbalanced currents during TURN-ON and TURN-OFF processes can pose the security and stability threats in the parallel connection of
Zheng Cao   +3 more
doaj   +1 more source

1.2‐kV silicon carbide planar split‐gate MOSFET with source field plate for superior figure‐of‐merits

open access: yesIET Power Electronics, 2022
Planar split‐gate MOSFETs (SG‐MOSFETs) are promising in high‐frequency power applications due to the fast turn on/off speeds and low switching loss. However, SG‐MOSFETs suffer from crowded electric field at the edge of the split poly‐Si gate, resulting ...
Hengyu Yu   +6 more
doaj   +1 more source

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