Results 11 to 20 of about 8,394,012 (247)
On the thermal activation of negative bias temperature instability [PDF]
2009 IEEE International Integrated Reliability Workshop Final Report, 2009 The temperature dependence of negative bias temperature instability (NBTI) is investigated on 2.0nm SiO 2 devices from temperatures ranging from 300K down to 6K with a measurement window of ∼12ms to 100s. Results indicate that classic NBTI degradation is observed down to ∼200K and rarely observed at temperatures below 140K in the experimental window ...
Southwick, Richard G., III +3 more
openaire +3 more sources
Self-checking monitor for NBTI due degradation [PDF]
, 2010 Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming of great concern for current and future CMOS technology.
C. Metra +12 more
core +1 more source
Applied Sciences, 2021 The degradation effect of a field-programmable gate array becomes a significant issue due to the high density of logic circuits inside the field-programmable gate array. The degradation effect occurs because of the rapid technology scaling process of the
Anuar Jaafar +4 more
doaj +1 more source
Data-Driven Modeling of Low Frequency Noise Using Capture-Emission Energy Maps
Applied Sciences, 2020 A new approach for modeling low frequency noise is presented to enable the predictions of noise behavior from negative bias temperature instability (NBTI). The noise model is based on a capture-emission energy (CEE) map describing the probability density
Jonghwan Lee
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Impact of bias temperature instability on soft error susceptibility [PDF]
, 2014 In this paper, we address the issue of analyzing the effects of aging mechanisms on ICs' soft error (SE) susceptibility. In particular, we consider bias temperature instability (BTI), namely negative BTI in pMOS transistors and positive BTI in nMOS ...
Metra, Cecilia +18 more
core +1 more source
Temperature stabilization for negative bias temperature instability [PDF]
, 2007 Previous research was conducted on a Complementary Metal Oxide Semiconductor (CMOS) to determine the impact of a phenomenon known as Negative Bias Temperature Instability (NBTI).
Harbison, Brian K.
core +2 more sources
Impact of NBTI Stress on VDMOSFET Regions
Algerian Journal of Signals and Systems, 2018 In this paper, we investigate the impact of negative bias temperature instability (NBTI) degradation on both channel and drain regions, of commercial power double diffused MOS transistor (VDMOSFET), using capacitance-voltage method (C-V). We report that
Sidi Mohammed Merah, Bouchra Nadji
doaj +1 more source
IEEE Journal of the Electron Devices Society, 2018 In this paper, we report on the electrical and thermal instability of β-Ga2O3 nanomembrane field-effect transistor with a bottom-gate configuration.
Jiyeon Ma, Oukjae Lee, Geonwook Yoo
doaj +1 more source
Impact of negative and positive bias temperature stress on 6T-SRAM cells [PDF]
Advances in Radio Science, 2009 With introduction of high-k gate oxide materials, the degradation effect <i>Positive Bias Temperature Instability</i> (PBTI) is starting to play an important role.
S. Drapatz +2 more
doaj
NBTI and Power Reduction Using an Input Vector Control and Supply Voltage Assignment Method
Algorithms, 2017 As technology scales, negative bias temperature instability (NBTI) becomes one of the primary failure mechanisms for Very Large Scale Integration (VLSI) circuits.
Peng Sun +4 more
doaj +1 more source