Results 51 to 60 of about 23,788 (263)
Aging Analysis and Degradation Prediction of PLL Circuits in 14-nm FinFET Technology
This work investigates the reliability and aging predictions in a 14-nm FinFET-based analog circuit under high-temperature conditions. Aging simulations and accelerated aging tests were carried out on key devices of phase-locked loop (PLL) circuits, with
Meng Li +6 more
doaj +1 more source
The energetic offset between the donor and the acceptor components in organic photoactive layers is central to the tradeoff between photovoltage and photocurrent losses. This Perspective covers the most important issues surrounding this topic in non‐fullerene acceptor blends, from the difficulty of accurately determining state energies and driving ...
Dieter Neher, Manasi Pranav
wiley +1 more source
In this paper, a coupled negative bias temperature instability (NBTI)/hot carrier degradation (HCD) failure model is proposed on the 2-D voltage plane for aging simulation of SRAM circuits.
Zhen Chai, Zhenyu Wu
doaj +1 more source
In the proposed model, a photoinduced nanoreactor uses Cu2O self‐photooxidation to generate localized supersaturation. A metastable supersaturation state first forms a shell, creating a spatially confined environment that restricts reactant exchange; continued Cu release then drives the local environment toward a labile regime that favors predominantly
Yongdeok Ahn +5 more
wiley +1 more source
The positive bias temperature instability (PBTI) reliability of buried InGaAs channel n-MOSFETs with an InP barrier layer and Al2O3 gate dielectric under medium field (2.7 MV/cm) and high field (5.0 MV/cm) are investigated in this paper.
Haiou Li +13 more
doaj +1 more source
Development of a novel method for synthesizing Ni single atom catalysts for highly selective electrochemical CO2 reduction in situ. This catalyst achieves 100% selectivity for CO and is formed in an industrially relevant cell architecture. Using post‐mortem XRD, STEM, and EDS and operando XAS, the identity of the active site and the mechanism behind ...
Ian Street +5 more
wiley +1 more source
This study reveals the pronounced density of oxygen vacancies (Vo) at the back channel of back-channel-etched (BCE) a-InGaZnO (a-IGZO) thin-film transistors (TFTs) results from the sputtered deposition rather than the wet etching process of the source ...
Shimin Ge +5 more
doaj +1 more source
Thickness‐Defined Transport Regime Toward Near‐Ideal Area‐Type Switching
By thinning the oxide layer, memristors pass from diode‐like and battery‐effect‐dominated behavior toward eventual short‐circuit failure. Within the intermediate 5–6 nm window, they reach a near‐ideal analog area‐type switching regime, featuring symmetric hysteresis, area‐dependent conductance, and continuous linear programming of HRS and LRS with ...
Cuo Wu +12 more
wiley +1 more source
Effectively confronting device and circuit parameter variations to maintain or improve the design of high performance and energy efficient systems while satisfying historical standards for reliability and lower costs is increasingly challenging with the ...
Jeren Samandari-Rad +2 more
doaj +1 more source
Life‐Like Ferrous Oxide Microspheres from Kombucha
Kombucha bacterial cellulose, sodium alginate, and ferrous nitrate self‐assemble into membrane‐enclosed iron oxide microspheres. These microspheres bud daughter vesicles, sustain 24‐h electrochemical oscillations, and filter theta‐band signals.
Panagiotis Mougkogiannis +2 more
wiley +1 more source

