Results 141 to 150 of about 3,700 (175)
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Plasma damage in HIMOS/spl trade/ non-volatile memories (NVM)
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866), 2004In this paper, for the first time, plasma induced damage (PID) on floating gate based non-volatile memory cells is reported. Since the cells consist of a complex combination of tunnel and gate oxides, combined with a dense frame of metal interconnect, the chance that these cells may be affected by plasma damage is evident.
J. Ackaert +6 more
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Characterization of tunnel oxides for non-volatile memory (NVM) applications
International Semiconductor Device Research Symposium, 2003, 2004The purpose of this paper is to characterize, to compare different types of tunnel oxides and to determine the impact on the MB (Moving Bit measurement) issues. The measurements and comparison carried out for the following tunnel oxide thickness in the range of 8 to 10 nm is used.
J. Ackaert +10 more
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Neobit/sup /spl reg// - high reliable logic non-volatile memory (NVM)
Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743), 2004In this paper, a new embedded OTP bit-cell (Neobit) is presented for one-/multiple-time programming (OTP/MTP) application, which is fabricated by using a generic logic process. Without additional processing or extra fabrication cost, this single-poly NVM can be implemented in various CMOS technologies such as logic, mixed-mode, analog, RF, HV and etc ...
R.S.C. Wang, R.S.J. Shen, C.C.H. Hsu
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International Journal of High Speed Electronics and Systems, 2020
This paper presents the theory, fabrication and experimental testing results for a multiple state Non-Volatile Memory (NVM), comprised of hafnium oxide high-k dielectric tunnel and gate barriers as well as a Silicon Quantum Dot Superlattice (QDSL) implemented for the floating gate and inversion channel (QDG) and (QDC) respectively. With the conclusion
N. R. Butterfield +4 more
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This paper presents the theory, fabrication and experimental testing results for a multiple state Non-Volatile Memory (NVM), comprised of hafnium oxide high-k dielectric tunnel and gate barriers as well as a Silicon Quantum Dot Superlattice (QDSL) implemented for the floating gate and inversion channel (QDG) and (QDC) respectively. With the conclusion
N. R. Butterfield +4 more
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The Journal of Supercomputing, 2018
The high density, low power consumption non-volatile memory (NVM) provides a promising DRAM alternative for the in-memory big-data processing applications, e.g., Spark, It is significant to simulate the behaviors when NVMs are deployed into the area of big-data processing before their widespread use in market.
Danqi Hu +6 more
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The high density, low power consumption non-volatile memory (NVM) provides a promising DRAM alternative for the in-memory big-data processing applications, e.g., Spark, It is significant to simulate the behaviors when NVMs are deployed into the area of big-data processing before their widespread use in market.
Danqi Hu +6 more
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A review of emerging non-volatile memory (NVM) technologies and applications
Solid-State Electronics, 2016Abstract This paper will review emerging non-volatile memory (NVM) technologies, with the focus on phase change memory (PCM), spin-transfer-torque random-access-memory (STTRAM), resistive random-access-memory (RRAM), and ferroelectric field-effect-transistor (FeFET) memory.
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AIP Conference Proceedings, 2011
Using PH3 N‐type plasma doing (PLAD), the device characteristics of high performance vertical switch diode for 50 nm phase‐change NVM have been studied. Compared to the conventional beam line ion implantation, there are improvements of diode breakdown voltage (B.V.) and isolation B.V., respectively 20% and 41% by N‐type PLAD doping due to the higher ...
Min Yong Lee +11 more
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Using PH3 N‐type plasma doing (PLAD), the device characteristics of high performance vertical switch diode for 50 nm phase‐change NVM have been studied. Compared to the conventional beam line ion implantation, there are improvements of diode breakdown voltage (B.V.) and isolation B.V., respectively 20% and 41% by N‐type PLAD doping due to the higher ...
Min Yong Lee +11 more
openaire +1 more source
Fuzzy NVM memory with non-volatility management
2021Dubeyko, Vyacheslav +1 more
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Non-Volatile memory (NVM) technologies
Journal of Systems Architecture, 2016Zili Shao, Yuan-Hao Chang
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