Results 91 to 100 of about 25,575,016 (220)
In the present study, p-GaN/AlGaN/GaN HEMTs treated with hydrogen plasma passivation were fabricated. Capacitance–voltage (C-V) and current–voltage(I-V) characteristics of these devices were subsequently measured.
Heyu Liu +7 more
doaj +1 more source
We report on the implementation of dynamic body-bias technique to improve the performance of AlGaN/GaN high electron mobility transistors (HEMTs) with the successful integration of body-diode.
Isra Mahaboob +5 more
doaj +1 more source
High Power Added Efficiency Enhancement-Mode Γ-Gate RF HEMT With High/Low p-GaN Doping Profile
$0.5~\mu $ m enhancement-mode (E-mode) p-GaN $\Gamma $ -gate RF HEMT with engineered Mg doping profile in p-GaN layer was studied for high power amplifier application.
Hsien-Chin Chiu +6 more
doaj +1 more source
Анализ параметров GaN-HEMT до и после гамма-нейтронного воздействия
Предложен метод математической обработки результатов измерений вольт-фарадных характеристик HEMT AlGaN/GaN до и после gamma-нейтронного облучения с флюенсом 0.4·1014 cм-2.
C.B. Оболенский +4 more
core +1 more source
Studio dei fenomeni di intrappolamento di carica e di degrado in dispositivi GaN-HEMT, con analisi dei fenomeni in dispositivi package attraverso misure dinamiche e DCreservedEmbargo permanente per motivi di segretezza e/o di proprietà dei risultati e ...
Girotto, Marco
core
A novel AlGaN/GaN HEMT is proposed to improve its single event transient (SET) effect and breakdown characteristics. The device features an AlGaN back barrier layer and a buried P-GaN island in the back barrier layer (BP-HEMT).
Shuxiang Sun +5 more
doaj +1 more source
Miller-Current Suppressing Technology for False Turn-On Protection of Commercial p-GaN HEMTs
Gallium Nitride (GaN) high-electron-mobility transistors (HEMTs) feature low ON resistance and low gate-input capacitance, so that they can serves as power switches with switching frequency from several MHz to tens of MHz level.
Ziheng Liu +9 more
doaj +1 more source
Hole Injection Effect and Dynamic Characteristic Analysis of Normally Off p-GaN HEMT with AlGaN Cap Layer on Low-Resistivity SiC Substrate. [PDF]
Wang HC +5 more
europepmc +1 more source
Studio del breakdown di dispositivi GaN HEMT di potenza
I meccanismi di off-state breakdown e di rottura in forward bias dei dispositivi GaN HEMT sono tutt'ora oggetto di studi. Obiettivo di questa tesi è perciò quello di indagare i fenomeni di rottura dei transistor di tre diversi wafer.
Cibin, Giulia
core
Stability of GaN HEMT Device Under Static and Dynamic Gate Stress
In this work, we investigated the stability of a ${p}$ -GaN gate with high electron mobility transistors (HEMTs) including an internal integrated gate circuit.
Linfei Gao +14 more
doaj +1 more source

