Results 41 to 50 of about 102 (93)

Status of Aluminum Oxide Gate Dielectric Technology for Insulated-Gate GaN-Based Devices. [PDF]

Materials (Basel), 2022
Calzolaro A, Mikolajick T, Wachowiak A.
europepmc   +1 more source

Implementation of Aging Mechanism Analysis and Prediction for XILINX 7-Series FPGAs with a 28-nm Process. [PDF]

Sensors (Basel), 2022
Li Z, Huang Z, Wang Q, Wang J, Luo N.
europepmc   +1 more source

Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization. [PDF]

Materials (Basel), 2021
Mukherjee K, De Santi C, Borga M, Geens K, You S, Bakeroot B, Decoutere S, Diehle P, Hübner S, Altmann F, Buffolo M, Meneghesso G, Zanoni E, Meneghini M.   +13 more
europepmc   +1 more source

Near-zero hysteresis van der Waals MnAl₂S₄ field-effect transistors with low minimal threshold voltage degradation and high thermal stability. [PDF]

Commun Mater
Sattari-Esfahlan SM, Illarionov Y, Xu F, Provias A, Mirzaei S, Michalička J, Knobloch T, Man O, Zhou Y, Grasser T.   +9 more
europepmc   +1 more source

Reliability and Stability Issues in Bi2O2Se/β-Bi2SeO5 Field-Effect Transistors. [PDF]

ACS Nano
Bahrami M, Davoudi MR, Verdianu A, Khakbaz P, Waldhoer D, Wilhelmer C, Tang J, Tan C, Nazir A, Zheng Y, Liu C, Peng H, Knobloch T, Waltl M, Grasser T.   +14 more
europepmc   +1 more source

Investigation on High-Temperature and High-Field Reliability of NMOS Devices Fabricated Using 28 nm Technology After Heavy-Ion Irradiation. [PDF]

Micromachines (Basel)
Cao Y, Zhang Z, Zhang L, Li M, Su S, Zhang W, Xu Y, Huang D, Liu L, Lv L, Ma X.   +10 more
europepmc   +1 more source

Stability and Reliability of van der Waals High-κ SrTiO₃ Field-Effect Transistors with Small Hysteresis. [PDF]

ACS Nano
Sattari-Esfahlan SM, Yang AJ, Ghosh R, Zheng W, Rzepa G, Knobloch T, Lanza M, Renshaw Wang X, Grasser T.   +8 more
europepmc   +1 more source

Enhanced soft error resilience of NBTI-tolerant dual mode Schmitt trigger circuit. [PDF]

Sci Rep
Kannaujiya A, Shah AP.
europepmc   +1 more source

Cross Comparison Between Thermal Cycling and High Temperature Stress on I/O Connection Elements. [PDF]

Micromachines (Basel)
Dhyani M, Avraham T, Bernstein JB, Bender E.   +3 more
europepmc   +1 more source

Semi-Automated Extraction of the Distribution of Single Defects for nMOS Transistors. [PDF]

Micromachines (Basel), 2020
Stampfer B, Schanovsky F, Grasser T, Waltl M.   +3 more
europepmc   +1 more source