Results 21 to 30 of about 27,419 (285)

Automation of Model Parameter Estimation for Random Telegraph Noise [PDF]

open access: yesIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, 2014
The modeling of random telegraph noise (RTN) of MOS transistors is becoming increasingly important. In this paper, a novel method is proposed for realizing automated estimation of two important RTN-model parameters: the number of interface-states and corresponding threshold voltage shift.
Hirofumi Shimizu   +3 more
openaire   +1 more source

Visualisation Techniques for Random Telegraph Signals in MOSFETs [PDF]

open access: yes, 2004
In the study of LF noise in MOSFETS, it has become clear that Random Telegraph Signals (RTS) are dominant. When a MOSFET is subjected to large-signal excitation, the RTS noise is influenced.
Hoekstra, Erik   +4 more
core   +7 more sources

Statistical Analysis of Random Telegraph Noises of MOSFET Subthreshold Currents Using a 1M Array Test Chip in a 40 nm Process

open access: yesIEEE Journal of the Electron Devices Society, 2021
It is difficult to measure the random telegraph noises (RTN) of MOSFET subthreshold currents at the sub-pA level directly and accurately. In this work, we used a charge integration method similar to the operation of the CMOS image sensors (CIS) to ...
Calvin Yi-Ping Chao   +7 more
doaj   +1 more source

Detection and analysis of random telegraph signal noise in P-MOSFET

open access: yesDianzi Jishu Yingyong, 2018
Power metal oxide semiconductor FET(P-MOSFET)is the core device that forms the power communication power,its reliability directly affects the safe and stable operation of power communication. Random telegraph signal(RTS) noise is a sensitive parameter to
Fan Xinxin   +3 more
doaj   +1 more source

Analysis of random telegraph noise in resistive memories: The case of unstable filaments

open access: yesMicro and Nano Engineering, 2023
Through Random Telegraph Noise (RTN) analysis, valuable information can be provided about the role of defect traps in fine tuning and reading of the state of a nanoelectronic device.
Nikolaos Vasileiadis   +4 more
doaj   +1 more source

Particle and Photon Detection: Counting and Energy Measurement

open access: yesSensors, 2016
Fundamental limits for photon counting and photon energy measurement are reviewed for CCD and CMOS imagers. The challenges to extend photon counting into the visible/nIR wavelengths and achieve energy measurement in the UV with specific read noise ...
James Janesick, John Tower
doaj   +1 more source

Model Implementation of Lorentzian Spectra for Circuit Noise Simulations in the Frequency Domain

open access: yesIEEE Journal of the Electron Devices Society, 2022
This work presents a new method for the Verilog-A implementation of Lorentzian noise models, in a module called VERILOR, which can automatically generate either Lorentzian or 1/f-like noise spectra depending on the trap density and gate oxide area, for ...
Angeliki Tataridou   +2 more
doaj   +1 more source

Effect of random telegraph noise on entanglement and nonlocality of a qubit-qutrit system [PDF]

open access: yesIranian Journal of Astronomy and Astrophysics, 2017
We study the evolution of entanglement and nonlocality of a non-interacting qubit-qutrit system under the effect of random telegraph noise (RTN) in independent and common environments in Markovian and non-Markovian regimes.
Hakimeh Jaghouri, Samira Nazifkar
doaj   +1 more source

An Experimental Approach to Characterizing the Channel Local Temperature Induced by Self-Heating Effect in FinFET

open access: yesIEEE Journal of the Electron Devices Society, 2018
In this paper, we have developed a methodology of a lateral profiling technique of the channel local temperature in 14 nm FinFET, incurred by the self-heating effect (SHE). As SHE happens, the thermal source generated near the drain will dissipate toward
E Ray Hsieh   +7 more
doaj   +1 more source

RTS noise impact in CMOS image sensors readout circuit [PDF]

open access: yes, 2010
CMOS image sensors are nowadays widely used in imaging applications even for high end applications. This is really possible thanks to a reduction of noise obtained, among others, by Correlated Double Sampling (CDS) readout.
Magnan, Pierre   +1 more
core   +1 more source

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