Results 21 to 30 of about 4,086 (177)

Deep Brain Stimulation Reduces Conflict‐Related Theta and Error‐Related Negativity in Patients With Obsessive–Compulsive Disorder

open access: yesNeuromodulation: Technology at the Neural Interface, EarlyView., 2021
Abstract Objectives Obsessive–compulsive disorder (OCD) is a psychiatric disorder with alterations of cortico‐striato‐thalamo‐cortical loops and impaired performance monitoring. Electrophysiological markers such as conflict‐related medial frontal theta (MFT) and error‐related negativity (ERN) may be altered by clinically effective deep brain ...
Elena Sildatke   +9 more
wiley   +1 more source

Theory of slow traps and random telegraph signals in ultra-small planar MOSFETs

open access: yesAIP Advances, 2023
It is shown that ultra-small MOSFETs with heavily doped substrates contain a significant concentration of slow traps in their space-charge regions. Such a trap arises due to random doping fluctuations and is created if a few shallow impurities form a ...
B. I. Fuks
doaj   +1 more source

Total Ionizing Dose Radiation-Induced Dark Current Random Telegraph Signal in Pinned Photodiode CMOS Image Sensors [PDF]

open access: yesIEEE Transactions on Nuclear Science, 2018
In this work, several studies on Total Ionizing Dose effects on Pinned Photodiode CMOS images sensors are presented. More precisely, the evolution of a parasitic signal called Random Telegraph Signal is analysed through several photodiode designs.
C. Durnez   +8 more
semanticscholar   +3 more sources

Statistical Analysis of Random Telegraph Noises of MOSFET Subthreshold Currents Using a 1M Array Test Chip in a 40 nm Process

open access: yesIEEE Journal of the Electron Devices Society, 2021
It is difficult to measure the random telegraph noises (RTN) of MOSFET subthreshold currents at the sub-pA level directly and accurately. In this work, we used a charge integration method similar to the operation of the CMOS image sensors (CIS) to ...
Calvin Yi-Ping Chao   +7 more
doaj   +1 more source

Proton Radiation-Induced Random Telegraph Signal in HgCdTe Photodiode Array

open access: yesIEEE Transactions on Nuclear Science, 2023
Random telegraph signals (RTSs) affect the performance of electronic devices such as photodiodes and transistors. The presence of this phenomenon in HgCdTe detectors has been reported in the past.
S. Dinand   +8 more
semanticscholar   +1 more source

Proton induced leakage current in CCDs [PDF]

open access: yes, 2003
The effect of different proton fluences on the performance of two E2V Technologies CCD47-20 devices was investigated with particular emphasis given to the analysis of 'random telegraph signal' (RTS) generation, bright pixel generation and induced changes
Ambrosi, RM   +4 more
core   +1 more source

Detection and analysis of random telegraph signal noise in P-MOSFET

open access: yesDianzi Jishu Yingyong, 2018
Power metal oxide semiconductor FET(P-MOSFET)is the core device that forms the power communication power,its reliability directly affects the safe and stable operation of power communication. Random telegraph signal(RTS) noise is a sensitive parameter to
Fan Xinxin   +3 more
doaj   +1 more source

Clusters of Defects as a Possible Origin of Random Telegraph Signal in Imager Devices: a DFT based Study

open access: yesInternational Conference on Simulation of Semiconductor Processes and Devices, 2021
The origin of the random telegraph signal (RTS) observed in semiconductors-based electronic devices is still subject to debates. In this work, by means of atomistic simulations, typical clusters of defects as could be obtained after irradiation or ...
A. Jay   +9 more
semanticscholar   +1 more source

RTS noise impact in CMOS image sensors readout circuit [PDF]

open access: yes, 2010
CMOS image sensors are nowadays widely used in imaging applications even for high end applications. This is really possible thanks to a reduction of noise obtained, among others, by Correlated Double Sampling (CDS) readout.
Magnan, Pierre   +1 more
core   +1 more source

Analysis and Validation of Low-Frequency Noise Reduction in MOSFET Circuits Using Variable Duty Cycle Switched Biasing

open access: yesIEEE Journal of the Electron Devices Society, 2018
In MOS transistors, low-frequency noise phenomena such as random telegraph signal (RTS), burst, and flicker or 1/f noise are usually attributed to the random nature of the trap state of defects present at the gate Si-SiO2 interface.
Kapil Jainwal, Mukul Sarkar, Kushal Shah
doaj   +1 more source

Home - About - Disclaimer - Privacy