Results 221 to 230 of about 2,332,362 (329)

MCHB-DETR: An Efficient and Lightweight Inspection Framework for Ink Jet Printing Defects in Semiconductor Packaging. [PDF]

Micromachines (Basel)
Chen Y, He J, Shi Z, Pan Y, Ou W.
europepmc   +1 more source

Intrinsic Dielectric Reliability in Semiconductor Materials: A Structural Admissibility Condition for Long-Term Electrical Integrity

Jorge Vasconcelos
openalex   +1 more source

Light‐Induced Entropy for Secure Vision

Advanced Materials, EarlyView.
This work realized a ternary true random number generator by exploiting stochastic traps emerging within multiple junction interfaces, and quantitatively validated the generation of high‐quality random numbers. Furthermore, it successfully demonstrated diverse applications, including AI‐resilient image security, thereby providing a valuable guide for ...
Juhyung Seo, Seungme Kang, Chaehyun Kim, Taehyun Park, Youngwoo Yoo, Yeong Kwon Kim, Wonjun Shin, Byung Chul Jang, Young‐Joon Kim, Hocheon Yoo   +9 more
wiley   +1 more source

Integrated Circuits on Fiber Substrates: State-of-the-Art System-on-Fiber Technologies for Smart Textiles and Wearables. [PDF]

Nanomicro Lett
Jin J, Won J, Kim D, Arumugasamy SK, Park S, Kim TW.   +5 more
europepmc   +1 more source

Scalable Solar Evaporator Based on Bandgap Engineered CuMnCrO4 Spinel Oxide with Salt‐Resistant Property for Contaminated Seawater

Advanced Materials, EarlyView.
Incorporating multiple cations (Cu2⁺ and Cr3⁺) into the Mn3O4 spinel lattice strategically tunes the electronic structure, narrowing the bandgap from 2.3 to 1.49 eV. This enhances visible–NIR light absorption and photothermal conversion, enabling a high water evaporation rate of 4.1 kg m−2 h−1 under 1 sun.
Rana Muhammad Irfan, Sungdo Kim, Jin Young Lee, Ji‐Hyun Jang   +3 more
wiley   +1 more source

A Fully Integrated Monolithic Monitor for Aging-Induced Leakage Current Characterization. [PDF]

Sensors (Basel)
Darko EN, Karimpour S, Adjei D, Tamakloe K, Chen D.   +4 more
europepmc   +1 more source

Heterogeneous Integration for Reduced Phase Noise and Improved Reliability of Semiconductor Lasers

, 2015
Sudharsanan Srinivasan
openalex   +1 more source

Role of the Recombination Zone in Organic Light‐Emitting Devices

Advanced Materials, EarlyView.
This review summarizes the critical role of the recombination zone in organic light‐emitting diodes (OLEDs). We highlight that broadening the recombination zone in OLEDs based on emissive layers with balanced charge transport and high photoluminescence quantum yields provides a promising route toward achieving both long operational lifetime and high ...
Yungui Li, Karl Leo
wiley   +1 more source

First Demonstration of Hysteresis-Free IGZO/SnO-Based Complementary Circuits and SRAM with Long-Term Reliability Using SU-8 Passivation. [PDF]

Nano Converg
Han C, Park H, Choi Y, Choi M, Lim J, Shin H, Moon S, Shin C.   +7 more
europepmc   +1 more source