Results 41 to 50 of about 2,168,094 (369)
Electrical Noise and Semiconductor Reliability
Electrotehnica, Electronica, Automatica, 2023 Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is particularly important to characterize noise in semiconductor devices.
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Validity of the parabolic effective mass approximation in silicon and germanium n-MOSFETs with different crystal orientations [PDF]
, 2007 This paper investigates the validity of the parabolic effective mass approximation (EMA), which is almost universally used to describe the size and bias-induced quantization in n-MOSFETs.
Esseni, David +4 more
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Review of power semiconductor device reliability for power converters
, 2017 The investigation shows that power semiconductor devices are the most fragile components of power electronic systems.Improving the reliability of power devices is the basis of a reliable power electronic system, and in recent years, many studies have ...
Bo Wang, Jie Cai, Xiong Du, Luowei Zhou
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Design of Ellipsoid and Spherical Combined Light Source for Uniform Flux and Color Mixing
IEEE Photonics Journal, 2019 In this letter, an ellipsoid–spherical combined light source structure is presented for the purpose of uniform flux and color mixing, when considering heat dissipation.
Rui-Min Zeng +8 more
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Synergistically Enhanced Performance and Reliability of Abrupt Metal‐Oxide Heterojunction Transistor
Advanced Electronic Materials, 2022 The large‐area low‐temperature processing capability and versatile characteristics of amorphous oxide semiconductor (AOS) thin‐film transistors (TFTs) are highly expected to promote the developments of next‐generation displays, 3D integrated circuit ...
Pengfei Wang +8 more
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VLSI Reliability in Europe [PDF]
, 1993 Several issue's regarding VLSI reliability research in Europe are discussed. Organizations involved in stimulating the activities on reliability by exchanging information or supporting research programs are described.
Verweij, J.F., Verweij, Jan F.
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High-Performance Deep SubMicron CMOS Technologies with Polycrystalline-SiGe Gates [PDF]
, 2000 The use of polycrystalline SiGe as the gate material for deep submicron CMOS has been investigated. A complete compatibility to standard CMOS processing is demonstrated when polycrystalline Si is substituted with SiGe (for Ge fractions below 0.5) to form
Ponomarev, Youri V. +4 more
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Nanoscale Research Letters, 2020 In this work, AlGaN double channel heterostructure is proposed and grown by metal organic chemical vapor deposition (MOCVD), and high-performance AlGaN double channel high electron mobility transistors (HEMTs) are fabricated and investigated.
Yachao Zhang +9 more
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, 2016 In semiconductor manufacturing, understanding how various materials behave and interact is critical to making a reliable and robust semiconductor package. Semiconductor Packaging: Materials Interaction and Reliability provides a fundamental understanding of the underlying physical properties of the materials used in a semiconductor package.
Chen, Andrea, Lo, Randy Hsiao-Yu
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Radiation, 2021 This article provides a review of semiconductor based ionising radiation sensors to measure accumulated dose and detect individual strikes of ionising particles. The measurement of ionising radiation (γ-ray, X-ray, high energy UV-ray and heavy ions, etc.)
Arijit Karmakar +4 more
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