Results 31 to 40 of about 123,696 (336)

Spectroscopic indications of tunnel barrier charging as the switching mechanism in memristive devices [PDF]

open access: yes, 2017
Resistive random access memory is a promising, energy-efficient, low-power “storage class memory” technology that has the potential to replace both flash storage and on-chip dynamic memory.
Asamitsu   +71 more
core   +1 more source

Morphology control of volatile resistive switching in La0.67Sr0.33MnO3 thin films on LaAlO3 (001)

open access: yesFrontiers in Nanotechnology, 2023
The development of in-memory computing hardware components based on different types of resistive materials is an active research area. These materials usually exhibit analog memory states originating from a wide range of physical mechanisms and offer ...
A. Jaman   +7 more
doaj   +1 more source

Modeling-Based Design of Memristive Devices for Brain-Inspired Computing

open access: yesFrontiers in Nanotechnology, 2021
Resistive switching random access memory (RRAM) has emerged for non-volatile memory application with the features of simple structure, low cost, high density, high speed, low power, and CMOS compatibility.
Yudi Zhao   +4 more
doaj   +1 more source

Effects of oxygen and moisture on the I-V characteristics of TiO2 thin films

open access: yesJournal of Materiomics, 2018
Current-voltage (I-V) characteristics well reveal the resistive switching performance of materials promising for the next-generation memory-resistance random access memory (ReRAM).
Wanheng Lu   +3 more
doaj   +1 more source

Controlled inter-state switching between quantized conductance states in resistive devices for multilevel memory [PDF]

open access: yes, 2019
A detailed understanding of quantization conductance (QC), their correlation with resistive switching phenomena and controlled manipulation of quantized states is crucial for realizing atomic-scale multilevel memory elements.
Deswal, Sweety   +3 more
core   +2 more sources

How ligands affect resistive switching in solution-processed HfO2 nanoparticle assemblies [PDF]

open access: yes, 2018
Advancement of resistive random access memory (ReRAM) requires fully understanding the various complex, defect-mediated transport mechanisms to further improve performance.
Wang, Jiaying   +6 more
core   +2 more sources

Tailored 2D/3D Halide Perovskite Heterointerface for Substantially Enhanced Endurance in Conducting Bridge Resistive Switching Memory.

open access: yesACS Applied Materials and Interfaces, 2020
Hybrid organic-inorganic halide perovskites (HPs) have garnered significant attention for use in resistive switching (RS) memory devices; this is due to their low cost, low operation voltage, high ON/OFF ratio, and excellent mechanical properties ...
SangMyeong Lee   +9 more
semanticscholar   +1 more source

Controlling Memristance and Negative Differential Resistance in Point‐Contacted Metal–Oxides–Metal Heterojunctions: Role of Oxygen Vacancy Electromigration and Electron Hopping

open access: yesAdvanced Intelligent Systems, 2022
Nonvolatile resistive switching memristance devices with a high on/off ratio are desirable for nanoelectronics such as resistive random‐access memory (RRAM) and in‐memory computing. Here, bipolar resistive switching in point‐contacted W/LaAlO3/SrTiO3(111)
Xin Gan   +7 more
doaj   +1 more source

Discussion On Device Structures And Hermetic Encapsulation For SiOx Random Access Memory Operation In Air [PDF]

open access: yes, 2014
An edge-free structure and hermetic encapsulation technique are presented that enable SiOx-based resistive random-access memory (RRAM) operation in air. A controlled etch study indicates that the switching filament is close to the SiOx surface in devices
Chang, Yao-Feng   +6 more
core   +1 more source

Resistive switching phenomena of HfO2 films grown by MOCVD for resistive switching memory devices [PDF]

open access: yesJournal of the Korean Physical Society, 2016
The resistive switching phenomena of HfO2 films grown by metalorganic chemical vapor deposition was studied for the application of ReRAM devices. In the fabricated Pt/HfO2/TiN memory cells, the bipolar resistive switching characteristics were observed, and the set and reset states were measured to be as low as 7 uA and 4 uA, respectively, at VREAD = 1 ...
Yun, Min Ju, Kim, Sungho, Kim, Hee-Dong
openaire   +2 more sources

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